Abstract: A method for forming a Ti1-xAlxN coating on a part without plasma enhancement, wherein a chemical vapor deposition chamber is heated to 250-500° C.; the part to be coated is heated to 550-650° C. and placed in said chamber; and a mixture of titanium and aluminium chlorides, NH3 and H2 is injected into the chamber. The molar amount of NH3 is greater than the molar amount of chlorides, and the molar amount of hydrogen is over five times greater than the molar amount of chlorides.

Abstract: The method of the present invention is directed to the formation of an arsenic silicon glass (ASG) film onto a silicon structure and finds a valuable application in the buried plate region formation process in the manufacture of deep trench cell capacitors in EDO and SDRAM memory chips. The starting structure is state-of-the-art and consists of a silicon substrate coated by a patterned SiO2/Si3N4 pad layer which defines deep trenches formed therein by etching. At the beginning of the conventional buried plate region formation, the interior side walls of deep trenches are coated with an arsenic doped silicon glass (ASG) film resulting from the co-pyrolysis of TEOS and TEASAT in a vertical hot dual wall LPCVD reactor as standard. According to the present invention, a flow of O2 is added which makes this co-pyrolysis of TEOS and TEASAT no longer interactive. As a consequence, the improved process is much better controlled than the conventional one.