Patents by Inventor Anne Van Veen

Anne Van Veen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8884247
    Abstract: A method and system for creating an asymmetrical lamella for use in an ex situ TEM, SEM, or STEM procedure is disclosed. The shape of the lamella provides for easy orientation such that a region of interest in the lamella can be placed over a hole in a carbon film providing minimal optical and spectral interference from the carbon film during TEM, SEM, or STEM procedure of chemical analysis.
    Type: Grant
    Filed: September 25, 2012
    Date of Patent: November 11, 2014
    Assignee: FEI Company
    Inventors: Thomas G. Miller, Jason Arjavac, Damon Heer, Michael Strauss, Gerardus Nicolaas Anne van Veen
  • Publication number: 20140084157
    Abstract: A method and system for creating an asymmetrical lamella for use in an ex situ TEM, SEM, or STEM procedure is disclosed. The shape of the lamella provides for easy orientation such that a region of interest in the lamella can be placed over a hole in a carbon film providing minimal optical and spectral interference from the carbon film during TEM, SEM, or STEM procedure of chemical analysis.
    Type: Application
    Filed: September 25, 2012
    Publication date: March 27, 2014
    Applicant: FEI Company
    Inventors: Thomas G. Miller, Jason Arjavac, Damon Heer, Michael Strauss, Gerardus Nicolaas Anne van Veen
  • Patent number: 8450820
    Abstract: The invention discloses a process for manufacturing a radiation detector for detecting e.g. 200 eV electrons. This makes the detector suited for e.g. use in an Scanning Electron Microscope. The detector is a PIN photodiode with a thin layer of pure boron connected to the p+-diffusion layer. The boron layer is connected to an electrode with an aluminium grid to form a path of low electrical resistance between each given point of the boron layer and the electrode. The invention addresses forming the aluminium grid on the boron layer without damaging the boron layer.
    Type: Grant
    Filed: January 13, 2011
    Date of Patent: May 28, 2013
    Inventors: Lis Karen Nanver, Thomas Ludovicus Maria Scholtes, Agata {hacek over (S)}akić, Cornelis Sander Kooijman, Gerard Nicolaas Anne van Veen
  • Publication number: 20130099114
    Abstract: A detector with a Silicon Diode and an amplifier, and a feedback element in the form of, for example, a resistor or a diode, switchably connected to the output of the amplifier. When the feedback element is selected via a switch, the detector operates in a Current Measurement Mode for determining electron current, and when the element is not selected the detector operates in its well-known Pulse Height Measurement Mode for determining the energy of X-ray quanta.
    Type: Application
    Filed: July 9, 2012
    Publication date: April 25, 2013
    Applicant: FEI Company
    Inventors: Cornelis Sander Kooijman, Gerardus Nicolaas Anne Van Veen
  • Patent number: 8424116
    Abstract: A sock having a toe portion, a heel and ankle portion, and a body portion disposed between the heel and ankle portion is disclosed. The body portion may comprise one or more elastic panels, which are incorporated in a manner to allow the sock to fit a wider range of standard foot sizes than a similar sock lacking the elastic panels disclosed herein.
    Type: Grant
    Filed: March 6, 2007
    Date of Patent: April 23, 2013
    Assignee: 7933657 Canada, Inc.
    Inventors: Mia Anastsopoulos, Dane Totham, Anne Van Veen, James Jones
  • Patent number: 8288724
    Abstract: The invention relates to a dark-field detector for an electron microscope. The detector comprises a photodiode for detecting the scattered electrons, with an inner electrode and an outer electrode. As a result of the resistive behavior of the surface layer the current induced by a scattered electron, e.g. holes, are divided over the electrodes, so that a current I1 and I2 is induced, the sum of the current proportional to the energy of the impinging electron and the normalized ratio a function of the radial position where the electron impinges.
    Type: Grant
    Filed: December 3, 2009
    Date of Patent: October 16, 2012
    Assignee: FEI Company
    Inventors: Cornelis Sander Kooijman, Gerardus Nicolaas Anne van Veen, Albertus Aemillius Seyno Sluijterman
  • Publication number: 20110169116
    Abstract: The invention discloses a process for manufacturing a radiation detector for detecting e.g. 200 eV electrons. This makes the detector suited for e.g. use in an Scanning Electron Microscope. The detector is a PIN photodiode with a thin layer of pure boron connected to the p+-diffusion layer. The boron layer is connected to an electrode with an aluminium grid to form a path of low electrical resistance between each given point of the boron layer and the electrode. The invention addresses forming the aluminium grid on the boron layer without damaging the boron layer.
    Type: Application
    Filed: January 13, 2011
    Publication date: July 14, 2011
    Applicant: FEI Company
    Inventors: Lis Karen Nanver, Thomas Ludovicus Maria Scholtes, Agata Sakic, Cornelis Sander Kooijman, Gerard Nicolaas Anne van Veen
  • Publication number: 20100258721
    Abstract: The invention relates to a dark-field detector for an electron microscope. The detector comprises a photodiode for detecting the scattered electrons, with an inner electrode and an outer electrode. As a result of the resistive behaviour of the surface layer the current induced by a scattered electron, e.g. holes, are divided over the electrodes, so that a current I1 and I2 is induced, the sum of the current proportional to the energy of the impinging electron and the normalized ratio a function of the radial position where the electron impinges.
    Type: Application
    Filed: December 3, 2009
    Publication date: October 14, 2010
    Applicant: FEI COMPANY
    Inventors: CORNELIS SANDER KOOIJMAN, Gerardus Nicolaas Anne van Veen, Albertus Aemillius Seyno Sluijterman
  • Publication number: 20090044313
    Abstract: A sock having a toe portion and a heel and ankle portion joined by a generally tubular body portion, wherein the body portion is formed in a composite fabric of an elastane and one or more other components such that the elastane density varies in the body portion in a manner effective to allow the sock to fit a wider range of standard foot sizes than for a similar sock having uniform elastane density in the body portion.
    Type: Application
    Filed: March 6, 2007
    Publication date: February 19, 2009
    Applicant: PACIFIC BRANDS CLOTHING PTY LTD
    Inventors: Mia Anastsopoulos, Dane Totham, Anne Van Veen, James Jones
  • Patent number: 7474419
    Abstract: A particle-optical apparatus comprising: A first source, for generating a first irradiating beam (E) along a first axis (A1); A second source, for generating a second irradiating beam (I) along a second axis (A2) that intersects the first axis at a beam intersection point, the first and second axes (A1, A2) defining a beam plane, A stage assembly (3) for positioning a sample in the vicinity of the beam intersection point, provided with: A sample table (21) to which the sample can be mounted; A set of actuators, arranged so as to effect translation of the sample table along directions substantially parallel to an X-axis perpendicular to the beam plane, a Y-axis parallel to the beam plane, and a Z-axis parallel to the beam plane, said X-axis, Y-axis and Z-axis being mutually orthogonal and passing through the beam intersection point, wherein the set of actuators is further arranged to effect: rotation of the sample table about a rotation axis (RA) substantially parallel to the Z-axis, and; rotation of the sa
    Type: Grant
    Filed: October 31, 2006
    Date of Patent: January 6, 2009
    Assignee: FEI Company
    Inventors: Hendrik Gezinus Tappel, Ian Johannes Bernardus van Hees, Danny Lankers, Gerard Nicolaas Anne van Veen, Richard Young, Lucille Ann Giannuzzi
  • Patent number: 6963068
    Abstract: The invention provides a method for the manufacture and transmissive irradiation of a sample, comprising the steps of: A Providing a particle-optical system having an internal low-pressure chamber and suitable for the generation of an electron beam and an intersecting ion beam in said chamber; B Providing a specimen within the chamber, carried by a manipulator; C Irradiating the specimen with the ion beam so as to cut a sample from the specimen; D Relatively displacing the sample thus cut to a sample holder than can be manipulated; E Attaching the sample to the sample holder; F Using an electron beam to perform transmissive irradiation of the sample thus attached to the sample holder, characterized in that step F is performed in the low-pressure chamber of the particle-optical system according to step A.
    Type: Grant
    Filed: January 15, 2004
    Date of Patent: November 8, 2005
    Assignee: FEI Company
    Inventors: Peter Emile Stephan Joseph Asselbergs, Hendrik Gezinus Tappel, Gerard Nicolaas Anne van Veen
  • Publication number: 20040144924
    Abstract: The invention provides a method for the manufacture and transmissive irradiation of a sample, comprising the steps of:
    Type: Application
    Filed: January 15, 2004
    Publication date: July 29, 2004
    Inventors: Peter Emile Stephan Joseph Asselbergs, Hendrik Gezinus Tappel, Gerard Nicolaas Anne van Veen