Abstract: A front-end device is configured to capture a light point image of an authenticatee and send the light point image to the back-end device, where the light point image is an image captured from the authenticatee under irradiation of multi-light points, and the light point image includes a face of the authenticatee. The back-end device of the authentication system is configured to perform face anti-spoofing detection on the authenticatee based on the received light point image to obtain an authentication result.

Abstract: An electrode with multiple metallic-layers structure formed by a magnetron sputtering technique for a semiconductor device and method for producing same is disclosed. The ceramic device includes at least one from selected group consisting of ZnO-MOV (metal oxide varistors), BaTiO3-PTC (positive temperature coefficient) thermistors, Mn3O4-NTC (negative temperature coefficient) thermistors, and capacitors. The multiple metallic-layers include a sputtered buffer layer and a sputtered electrical contact layer. The buffer layer includes at least one alloy selected form group consisting of NiCr (Ni from 50-90 wt %), TiNi (Ti from 40-60 wt %), and AlNi (Al from 40-70 wt %) and the thickness of this layer is from greater than zero to less than 100 nm. The electrical contact layer includes at least one of Cu, Ag, Pt, Au, or combination. More specifically, the electrode includes one of NiCr/Cu system, NiCr/Ag system, NiCr/Cu/Ag system, TiNi/Cu/Ag system, or AlNi/Cu/Ag system.

Abstract: A method and device for characterizing microbial carbonate pores, and a server. Acquiring a user's detailed observational description of a profile of a microbial carbonate to be analyzed, and determining a full-diameter core sample on the microbial carbonate; performing pore characterization and a first pore test on the full-diameter core sample to determine a centimeter-scale pore parameter; determining a sampling position on the full-diameter core sample, and sampling on the full-diameter core sample to obtain a plunger sample; performing a second pore test on the plunger sample to determine a millimeter-scale pore parameter; determining a sampling position on the plunger sample according to the millimeter-scale pore parameter, and sampling on the plunger sample to obtain a scanning electron microscope (SEM) sample and a casting thin section sample; and performing a pore test on the SEM sample and the casting thin section sample to determine a micron-to-nanoscale pore parameter.

Abstract: An electrode with multiple metallic-layers structure formed by a magnetron sputtering technique for a semiconductor device and method for producing same is disclosed. The ceramic device includes at least one from selected group consisting of ZnO-MOV (metal oxide varistors), BaTiO3-PTC (positive temperature coefficient) thermistors, Mn3O4-NTC (negative temperature coefficient) thermistors, and capacitors. The multiple metallic-layers include a sputtered buffer layer and a sputtered electrical contact layer. The buffer layer includes at least one alloy selected form group consisting of NiCr (Ni from 50-90 wt %), TiNi (Ti from 40-60 wt %), and AlNi (Al from 40-70 wt %) and the thickness of this layer is from greater than zero to less than 100 nm. The electrical contact layer includes at least one of Cu, Ag, Pt, Au, or combination. More specifically, the electrode includes one of NiCr/Cu system, NiCr/Ag system, NiCr/Cu/Ag system, TiNi/Cu/Ag system, or AlNi/Cu/Ag system.

Abstract: A method and device for characterizing microbial carbonate pores, and a server. Acquiring a user's detailed observational description of a profile of a microbial carbonate to be analyzed, and determining a full-diameter core sample on the microbial carbonate; performing pore characterization and a first pore test on the full-diameter core sample to determine a centimeter-scale pore parameter; determining a sampling position on the full-diameter core sample, and sampling on the full-diameter core sample to obtain a plunger sample; performing a second pore test on the plunger sample to determine a millimeter-scale pore parameter; determining a sampling position on the plunger sample according to the millimeter-scale pore parameter, and sampling on the plunger sample to obtain a scanning electron microscope (SEM) sample and a casting thin section sample; and performing a pore test on the SEM sample and the casting thin section sample to determine a micron-to-nanoscale pore parameter.

Abstract: An object of the present invention is to provide a management method of network device, which can implement concentrate management of a large number of network devices with a small amount of IP resources, and thereby reducing maintenance workload and facilitating network management.

Abstract: An object of the present invention is to provide a management method of network device, which can implement concentrate management of a large number of network devices with a small amount of IP resources, and thereby reducing maintenance workload and facilitating network management.