Abstract: The present invention concerns a method for measuring a chip integrated structure (1) including at least one coil (5) having a plurality of turns (6). The present invention is characterized on the following steps: measuring the resistance across the terminals of first and second portions of said coil (5), corresponding to two different numbers of turns of the coil; computing the ratio of the measured resistances across the terminals of first and second portions of the coil (5); comparing the ratio to a constant measured from a sample of resistance measurements made on coils of identical geometry; and determining the presence or the absence of a short circuit between at least two turns of one of said portions of said coil (5), when the ratio is different from or equal to said constant respectively. The present invention further concerns an integrated circuit which is able to allow implementation of the above mentioned measuring method.

Abstract: The object of the procedure according to the present invention is to characterise a voltage or current converter (20) intended to be connected to a capacitive circuit (32) arranged so as to provide a capacitance difference (C1−C2) to the converter. Said converter is arranged so as to be able to receive the capacitance difference provided by the circuit, and to provide an output voltage (Vo) which is a function of the capacitance difference and a bias signal. This procedure is characterised in that it includes a sequence of steps which consist in varying the bias signal, while keeping the capacitance difference constant and measuring in response the output voltage. One advantage of such a procedure lies in the fact that it allows the electric performance of the converter to be determined independently of the error link to the capacitance measuring.