Patents by Inventor Antanas Daugela
Antanas Daugela has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11835546Abstract: A method of creating and characterizing a representative image or signal transform of the surface of an object from acoustic emissions or ultrasonic signals of a multimode ultrasonic probe tip and transducer integrated into a micro tool, such as a nano indenter or a nano indenter interfaced with a Scanning Probe Microscope (SPM). The representative image or renderings may be utilized to predict mechanical properties or characteristics of the sample, including topography, fracture patterns, indents and artifacts. The tip component is configured to operate at multi-resonant frequencies providing sub-nanometer vertical resolution. The tip component may be quasi- statistically calibrated and deep learning iterative image comparison and characterization may be utilized to derive mechanical properties of a sample.Type: GrantFiled: May 29, 2022Date of Patent: December 5, 2023Assignee: NANOMETRONIX LLCInventor: Antanas Daugela
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Patent number: 11346857Abstract: A method of creating and characterizing a representative image of the surface of an object from acoustic emissions of a multimode ultrasonic probe tip and transducer integrated into a micro tool, such as a nano indenter or a nano indenter interfaced with a Scanning Probe Microscope (SPM). The representative image may be utilized to predict mechanical properties or characteristics of the sample, including topography, fracture patterns, indents and artifacts. The tip component is configured to operate at multi-resonant frequencies providing sub-nanometer vertical resolution. The tip component may be quasi-statistically calibrated and deep learning iterative image comparison and characterization may be utilized to derive mechanical properties of a sample.Type: GrantFiled: August 4, 2021Date of Patent: May 31, 2022Inventor: Antanas Daugela
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Patent number: 9953673Abstract: A storage device disclosed herein includes a transducer head with a proximity sensor that generates head-disc proximity signals, a digitizer configured to convert the analog proximity signals from the proximity sensor to digitized sample data, a discrete wavelet transformation (DWT) module configured to analyze the digitized sample data by performing an enhanced DWT on the digitized sample data to generate DWT coefficients, and a modal filter configured to determine dominant head-disc interference (HDI) modes for a transducer head by analyzing the DWT coefficients.Type: GrantFiled: July 1, 2016Date of Patent: April 24, 2018Assignee: SEAGATE TECHNOLOGY LLCInventors: Antanas Daugela, Jon D. Trantham, Scott E. Ryun
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Patent number: 9905273Abstract: An apparatus includes an actuator assembly, a dampening assembly coupled to the actuator assembly, and a vibration sensor assembly coupled to the dampening assembly and coupled to the actuator assembly by way of the dampening assembly. A method includes attaching a dampening assembly to an actuator assembly and attaching a vibration sensor assembly to the dampening assembly. The dampening assembly is positioned between the vibration sensor assembly and the actuator assembly.Type: GrantFiled: April 26, 2016Date of Patent: February 27, 2018Assignee: Seagate Technology LLCInventors: Antanas Daugela, Neal F. Gunderson, Reed D. Hanson, Ricardo P. Freeman, Andrew R. Motzko, Erik J. Lindquist
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Patent number: 9885691Abstract: A multimode ultrasonic probe tip and transducer integrated into a micro tool, such as a nano indenter or a nano indenter interfaced with a Scanning Probe Microscope (SPM) is described. The tip component may be utilized to determine mechanical properties or characteristics of a sample, including for example, complex elastic modulus, hardness, friction coefficient, and strain and stress at nanometer scales and high frequencies. The tip component is configured to operate at multi-resonant frequencies providing sub-nanometer vertical resolution. The tip component may be quasi-statistically calibrated and contact mechanics constitutive equations may be utilized to derive mechanical properties of a sample. Contact mechanical impedance and acoustic impedance may also be compared.Type: GrantFiled: July 31, 2017Date of Patent: February 6, 2018Assignee: Nanometronix LLCInventor: Antanas Daugela
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Publication number: 20180005657Abstract: A storage device disclosed herein includes a transducer head with a proximity sensor that generates head-disc proximity signals, a digitizer configured to convert the analog proximity signals from the proximity sensor to digitized sample data, a discrete wavelet transformation (DWT) module configured to analyze the digitized sample data by performing an enhanced DWT on the digitized sample data to generate DWT coefficients, and a modal filter configured to determine dominant head-disc interference (HDI) modes for a transducer head by analyzing the DWT coefficients.Type: ApplicationFiled: July 1, 2016Publication date: January 4, 2018Inventors: Antanas Daugela, Jon D. Trantham, Scott E. Ryun
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Publication number: 20170309312Abstract: An apparatus includes an actuator assembly, a dampening assembly coupled to the actuator assembly, and a vibration sensor assembly coupled to the dampening assembly and coupled to the actuator assembly by way of the dampening assembly. A method includes attaching a dampening assembly to an actuator assembly and attaching a vibration sensor assembly to the dampening assembly. The dampening assembly is positioned between the vibration sensor assembly and the actuator assembly.Type: ApplicationFiled: April 26, 2016Publication date: October 26, 2017Inventors: Antanas Daugela, Neal F. Gunderson, Reed D. Hanson, Ricardo P. Freeman, Andrew R. Motzko, Erik J. Lindquist
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Patent number: 9753016Abstract: A multimode ultrasonic probe tip and transducer integrated into a micro tool, such as a nano indenter or a nano indenter interfaced with a Scanning Probe Microscope (SPM) is described. The tip component may be utilized to determine mechanical properties or characteristics of a sample, including for example, complex elastic modulus, hardness, friction coefficient, and strain and stress at nanometer scales and high frequencies. The tip component is configured to operate at multi-resonant frequencies providing sub-nanometer vertical resolution. The tip component may be quasi-statistically calibrated and contact mechanics constitutive equations may be utilized to derive mechanical properties of a sample. Contact mechanical impedance and acoustic impedance may also be compared.Type: GrantFiled: October 8, 2014Date of Patent: September 5, 2017Assignee: Nanometronix LLCInventor: Antanas Daugela
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Patent number: 9001452Abstract: In one implementation, a method and apparatus is provided for determining an active fly height setting for a transducer head from samples collected from a proximity sensor during less than a single revolution of a disc. Implementations of the method and system use adaptive discrete wavelet transform parameters generated from the collected samples to determine an active fly height setting for a transducer head.Type: GrantFiled: October 25, 2013Date of Patent: April 7, 2015Assignee: Seagate Technology LLCInventors: Antanas Daugela, Jon D. Trantham, Srinivas Tadepalli
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Publication number: 20140268407Abstract: In one implementation, a method and apparatus is provided for determining an active fly height setting for a transducer head from samples collected from a proximity sensor during less than a single revolution of a disc. Implementations of the method and system use adaptive discrete wavelet transform parameters generated from the collected samples to determine an active fly height setting for a transducer head.Type: ApplicationFiled: October 25, 2013Publication date: September 18, 2014Applicant: Seagate Technology LLCInventors: Antanas Daugela, Jon D. Trantham, Srinivas Tadepalli
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Patent number: 7742255Abstract: Apparatus and method for head-disc interface (HDI) modal response monitoring. A sensing element disposed on a rigid actuator arm is mechanically impedance matched to a head-disc interface (HDI) supported by the actuator arm to resonate at a predetermined frequency corresponding to at least one disturbance associated with the HDI.Type: GrantFiled: July 11, 2007Date of Patent: June 22, 2010Assignee: Seagate Technology LLCInventors: Antanas Daugela, Subra Nagarajan, Jason W. Riddering, Neal F. Gunderson, John S. Wright, Stefan A. Ionescu, Rick P. Freeman, Erick J. Lindquist, Andrew R. Motzko, Zine Eddine Boutaghou
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Publication number: 20090015962Abstract: Apparatus and method for head-disc interface (HDI) modal response monitoring. A sensing element disposed on a rigid actuator arm is mechanically impedance matched to a head-disc interface (HDI) supported by the actuator arm to resonate at a predetermined frequency corresponding to at least one disturbance associated with the HDI.Type: ApplicationFiled: July 11, 2007Publication date: January 15, 2009Applicant: Seagate Technology LLCInventors: ANTANAS DAUGELA, Subra Nagarajan, Jason W. Riddering, Neal F. Gunderson, John S. Wright, Stefan A. Ionescu, Rick P. Freeman, Erik J. Lindquist, Andrew R. Motzko, Zine Eddine Boutaghou
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Patent number: 6289734Abstract: The present invention provides a portable test system for in-situ, non-destructive identification of visco-elastic material. The system includes a probe-like member coupled to a controller, wherein the controller is responsive to an output signal from the probe-like member for determining properties of the visco-elastic material. The probe-like member includes a longitudinally extending housing. A transducer mechanism is operably positioned within the housing. The transducer mechanism includes an indentation tip member, wherein the indentation tip member is extendable through the housing. A load mechanism is provided for loading the transducer mechanism with a desired constant load, causing the indentation tip member to extend through the housing to perform an indentation. A force calibration mechanism is provided for calibrating the application of a fixed force between the indentation tip member and the visco-elastic material.Type: GrantFiled: March 1, 1999Date of Patent: September 18, 2001Assignee: Hysitron, IncorporatedInventor: Antanas Daugela