Abstract: An integrated circuit, including: a pulse generator adapted to generate a pulsed signal; a cycle counter adapted to count cycles of the pulsed signal; one or more repairable circuit elements; and a repair processor adapted to repair a repairable circuit element when the cycle counter reaches a pre-determined cycle count.

Abstract: A clock and data recovery circuit including: means for generating a first and a second clock signal; means for receiving the first clock signal and for generating a third clock signal from the first clock signal and means for receiving the second clock signal and for generating a fourth clock signal, wherein at least one of the third and the fourth clock signals differ in phase from the first and the second clock signal respectively; means for receiving the third and fourth clock signals and a serial data stream and for generating a reconstructed serial data stream and a phase error signal; means for receiving the phase error signal and for generating a phase adjustment signal and means for receiving the phase adjustment signal by the by the clock generation circuit in a feedback loop to adjust the phases of the first and second clock signals.

Abstract: Analog supply for an analog circuit and process for supplying an analog signal to an analog circuit. The analog supply includes a noise filter having a variable resistor, and a control device coupled to adjust the variable resistor. The control device is structured and arranged to set the resistance of the variable resistor to maximize noise filtering and optimize performance of the analog circuit.

Abstract: In a first aspect, a first method of adjusting capacitance of a semiconductor device is provided. The first method includes the steps of (1) providing a transistor including a dielectric material having a dielectric constant of about 3.9 to about 25, wherein the transistor is adapted to operate in a first mode to provide a capacitance and further adapted to operate in a second mode to change a threshold voltage of the transistor from an original threshold voltage to a changed threshold voltage such that the changed threshold voltage affects a capacitance provided by the transistor when operated in the first mode; and (2) employing the transistor in a circuit. Numerous other aspects are provided.

Abstract: In a first aspect, a first apparatus is provided. The first apparatus is a memory element that includes (1) one or more MOSFETs each including a dielectric material having a dielectric constant of about 3.9 to about 25; and (2) control logic coupled to at least one of the one or more MOSFETs. The control logic is adapted to (a) cause the memory element to operate in a first mode to store data; and (b) cause the memory element to operate in a second mode to change a threshold voltage of at least one of the one or more MOSFETs from an original threshold voltage to a changed threshold voltage such that the changed threshold voltage affects data stored by the memory element when operated in the first mode. Numerous other aspects are provided.

Abstract: A method for altering circuit characteristics to make them independent of processing parameters of devices within an integrated circuit is disclosed. A process parameter is measured by a kerf or on-chip built-in test on a selective set of chip on a wafer, and the results are stored on a storage device within each respective chip. Then, for each of the remaining chips, a two-dimensional interpolation is performed to determine the process parameter value for the respective chip based on the measured value. The interpolated values are recorded along with the coordinates of the chip in an efuse control file. Such information is subsequently stored into an efuse module within the chip. On-chip digital control structures are used to adjust certain operational characteristics of a functional component within the chip based on the information stored in the efuse module.

Abstract: A loop filter for a phase-locked-loop is provided, comprising a set of capacitor banks coupled in parallel to form the loop filter, and a detection circuit for identifying and isolating defective capacitor banks. A method for providing a loop filter for a phase-locked-loop in accordance with an embodiment of the present invention includes the steps of forming the loop filter using a set of capacitor banks coupled in parallel, detecting any defective capacitor banks in the set of capacitor banks, isolating each defective capacitor bank, providing a set of redundant capacitor banks, and replacing each defective capacitor bank with a redundant capacitor bank from the set of redundant capacitor banks.

Abstract: Techniques and apparatus for testing phase rotators for detecting defective tap weights are provided. Phase rotator test logic may include a master phase rotator to cycle the phase of a clock signal distributed to operational phase rotators through an entire cycle of phases (e.g., an entire 360 degree rotation). Each operational phase rotator should respond with an equal but opposite phase shift in order to maintain phase lock. Thus, after sweeping, each tap weight is exercised, which may help ensure defective tap weights in any (e.g., quadrant) are detected during testing.

Abstract: Techniques and apparatus for testing jitter tolerance of a device are provided. Jitter control logic within a device may include a master phase rotator to rapidly adjust the phase of a clock signal to simulate jitter in a data stream received by the device. For some embodiments, the rate, magnitude, and signature (or waveform shape) of the phase adjustments may be controlled to simulate high frequency jitter. Errors in received data packets may be monitored while simulating this jitter (e.g., as part of a built in self test) to test the jitter tolerance of a device under test.

Abstract: A solution for determining minimum operating voltages due to performance/power requirements would be valid for a wide range of actual uses. The solution includes a test flow methodology for dynamically reducing power consumption under applied conditions while maintaining application performance via a BIST circuit. There is additionally provided a test flow method for dynamically reducing power consumption to the lowest possible stand-by/very low power level under applied conditions that will still be sufficient to maintain data/state information. One possible application would be for controlling the voltage supply to a group of particular circuits on an ASIC (Application Specific Integrated Circuit). These circuits are grouped together in a voltage island where they would receive a voltage supply that can be different from the voltage supply other circuits on the same chip are receiving. The same solution could be applied to a portion of a microprocessor (the cache logic control, for example).

Abstract: A body-biased enhanced current mirror reference circuit is disclosed wherein the body bias voltage of a current mirror device is varied to adjust its threshold voltage. Both the drain and body potentials of a replica mirror transistor are controlled to selected values. The drain is set to an expected DC voltage output of an NFET current mirror device. The body potential is set to a maximum desired value to prevent forward biasing of the body-to-diffusion junction(s) of one or more current mirror devices, which is accomplished by a feedback control circuit. A low-frequency, low-precision op amp drives the gate of a replica load device so that the body of the replica NFET current mirror device is set to a maximum bias voltage. The maximum bias voltage is also used to bias the body of a diode connected NMOS reference transistor, so that the current in the NFET current mirror device will be approximately equal to the current in the diode-connected NMOS reference.

Abstract: Techniques and systems whereby operation of and/or access to particular features of an electronic device may be controlled after the device has left the control of the manufacturer are provided. The operation and/or access may be provided based on values stored in non-volatile storage elements, such as electrically programmable fused (eFUSES).

Abstract: An integrated circuit amplifier includes, in an exemplary embodiment, a first field effect transistor (FET) device configured as a source follower and a second FET device configured as a tunneling gate FET, the tunneling gate FET coupled to the source follower. The tunneling gate FET is further configured so as to set a transconductance of the amplifier and the source follower is configured so as to set an output conductance of the amplifier.

Abstract: A differential sinusoidal signal pair is generated on an integrated circuit (IC). The differential sinusoidal signal pair is distributed to clock receiver circuits, which may be differential amplifiers. The clock receiver circuits receive the differential sinusoidal signal pair and convert the differential sinusoidal pair to local clock signals. Power consumption and noise generation are reduced as compared to conventional clock signal distribution arrangements.

Abstract: A method for controlling the common-mode output voltage in a fully differential amplifier includes comparing a sensed common-mode output voltage of the fully differential amplifier to a reference voltage, and generating an error signal representing the difference between the sensed common-mode output voltage and the reference voltage. The error signal is utilized to control the body voltage of one or more FET devices included within the fully differential amplifier until the sensed common-mode output voltage is in agreement with said reference voltage.

Abstract: A method a circuit for preventing failure in an integrated circuit. The circuit including: an original circuit; one or more redundant circuits; and a repair processor, including a clock cycle counter adapted to count pulses of a pulsed signal, the repair processor adapted to (a) replace the original circuit with a first redundant circuit or (b) adapted to select another redundant circuit, the selection in sequence from a second redundant circuit to a last redundant circuit, and to replace a previously selected redundant circuit with the selected redundant circuit each time the cycle counter reaches a predetermined count of a set of predetermined cycle counts.

Abstract: An integrated circuit, including: a pulse generator adapted to generate a pulsed signal; a cycle counter adapted to count cycles of the pulsed signal; one or more repairable circuit elements; and a repair processor adapted to repair a repairable circuit element when the cycle counter reaches a pre-determined cycle count.

Abstract: A circuit, including: a capacitor coupled between a first circuit node and a second circuit node and that leaks a leakage current from the first circuit node to the second circuit node; and a compensation circuit adapted to supply a compensatory current to compensate for the leakage current to the first circuit node.

Abstract: A structure and method for damping LC (inductance-capacitance) ringing in integrated circuit (IC) power distribution systems. The structure comprises a resistance electrically connected in parallel with a plurality of electrical switches. The resistance and electrical switches are electrically connected in series with the package and on-chip power distribution circuit. When on-chip switching activity creates a sudden and appreciable change in IC power demand the electrical switches are opened to temporarily increase the resistance in series with the power supply. This serves to dampen the power-distribution LC ringing. Later, the electrical switches are closed to shunt the series resistance and reduce the level of steady-state voltage drop in the power structure.

Abstract: A pseudo-random binary sequence checker having automatic synchronization is disclosed. The pseudo-random binary sequence checker includes a receiver, a synchronizer, and a comparator. The receiver is capable of receiving a pseudo-random binary sequence, which is generated by a pseudo-random binary sequence generator, in a parallel fashion n bits at a time. The synchronizer automatically synchronizes the state of the receiver with an n-bit sample within the pseudo-random binary sequence and calculate all subsequent n-bit sample within the pseudo-random binary sequence. The comparator compares the subsequent calculated n-bit sample within the pseudo-random binary sequence to the next subsequent next received n-bit sample within the pseudo-random binary sequence to indicate an error condition has occurred if each calculated n-bit sample within the pseudo-random binary sequence does not equal to the corresponding received n-bit sample within the pseudo-random binary sequence.