Abstract: A system for remote-controlling a spectrometer, which includes: at least one spectrometry device including a spectrometer and auxiliary modules, the spectrometry device being configured to measure spectrometry data on an object and/or a process; a control device configured to control the spectrometry device, the control device including an element for controlling the spectrometry device, an element for acquiring and processing the spectrometry data, and an element for remote communication; and at least one interface modules configured to communicate with the control device remotely. The remote-control device is configured to communicate with the interface module via Internet, and the spectrometry device is interchangeable. Also, a device for remote-controlling a spectrometry system that is configured to be used in a system for remote-controlling the spectrometer.

Abstract: A method for configuring a target spectrometry device using a reference spectrometry device. The method involves: acquiring spectral measurements for a set of reference samples with the reference spectrometer and storing the spectral measurements in a reference database; acquiring target spectral measurements for a sub-set of reference samples with the target spectrometer and storing the spectral measurements in a target database; determining an average spectrum for each reference sample from the reference and target spectral measurements; determining a series of spectra for each average spectrum, which includes determining an optical transfer function of the target spectrometer and applying the optical transfer function to each average spectrum measured by the reference spectrometer; and storing the average spectrum and series of spectra of each reference sample in the target database. The determining steps use a computing module. Also, a spectrometry device configured for the method.

Abstract: A system for remote-controlling a spectrometer, which includes: at least one spectrometry device including a spectrometer and auxiliary modules, the spectrometry device being configured to measure spectrometry data on an object and/or a process; a control device configured to control the spectrometry device, the control device including an element for controlling the spectrometry device, an element for acquiring and processing the spectrometry data, and an element for remote communication; and at least one interface modules configured to communicate with the control device remotely. The remote-control device is configured to communicate with the interface module via Internet, and the spectrometry device is interchangeable. Also, a device for remote-controlling a spectrometry system that is configured to be used in a system for remote-controlling the spectrometer.

Abstract: An operating system cartridge for an annular blowout preventer includes one or more annular walls that define an annular chamber. The operating system cartridge also includes a piston assembly that has an annular piston positioned within the annular chamber and a pusher plate configured to contact an annular packer assembly of the annular blowout preventer when the operating system cartridge is installed within a housing of the annular blowout preventer. The operating system cartridge further includes one or more fluid conduits extending through the one or more annular walls, wherein the one or more fluid conduits are configured to provide a test fluid to the annular chamber to facilitate testing of the operating system cartridge prior to installation within the housing of the annular blowout preventer.

Abstract: The invention relates to a characterization device (50) for characterizing a sample (S) comprising: a memory (MEM) storing a measured spectrum (As+p) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (Ap), a processing unit (PU) configured to: determine a spectral energy (Es+p) of the measured spectrum (As+p) of the sample through the translucent material (As+p), estimate a coefficient ({circumflex over (?)}) from said spectral energy (Es+p) and, determine a corrected spectrum (Âs) of the sample from the measured spectrum (As+p) of the sample through the translucent material and from a corrected spectrum of the translucent material (Âp), said corrected spectrum of the translucent material (Âp) being determined from the measured spectrum of the translucent material (Ap) and from the estimated coefficient ({circumflex over (?)}).

Abstract: An operating system cartridge for an annular blowout preventer includes one or more annular walls that define an annular chamber. The operating system cartridge also includes a piston assembly that has an annular piston positioned within the annular chamber and a pusher plate configured to contact an annular packer assembly of the annular blowout preventer when the operating system cartridge is installed within a housing of the annular blowout preventer. The operating system cartridge further includes one or more fluid conduits extending through the one or more annular walls, wherein the one or more fluid conduits are configured to provide a test fluid to the annular chamber to facilitate testing of the operating system cartridge prior to installation within the housing of the annular blowout preventer.

Abstract: The invention relates to a characterization device (50) for characterizing a sample (S) comprising: a memory (MEM) storing a measured spectrum (As+p) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (Ap), a processing unit (PU) configured to: determine a spectral energy (Es+p) of the measured spectrum (As+p) of the sample through the translucent material (As+p), estimate a coefficient ({circumflex over (?)}) from said spectral energy (Es+p) and, determine a corrected spectrum (Âs) of the sample from the measured spectrum (As+p) of the sample through the translucent material and from a corrected spectrum of the translucent material (Âp), said corrected spectrum of the translucent material (Âp) being determined from the measured spectrum of the translucent material (Ap) and from the estimated coefficient ({circumflex over (?)}).