Abstract: An automated testing system comprises a high side switch circuit coupled to an input/output (I/O) connection, a low side switch circuit coupled to the I/O connection, a high side force amplifier (HFA) coupled to the high side switch, a low side force amplifier (LFA) coupled to the low side switch, an adjusting circuit coupled to the HFA and the LFA, and a control circuit configured to change the adjusting circuit to change control of current at the I/O connection from one of the HFA or LFA to the other of the HFA or LFA.

Abstract: A system for changing voltage states at an output of an electronic device. In one embodiment, the system includes a voltage conveyor module coupled to the output of the electronic device and a voltage signal generator capable of producing a first voltage at the output. The voltage conveyor module is controllably coupled to the output, and the voltage signal generator is controllably uncoupled from the output of the electronic device. The voltage conveyor conveys the second voltage to the output in a characteristic manner. The second voltage level is provided as input to the voltage signal generator and the voltage signal generator is recoupled to the output of the electronic device. The voltage conveyor is then electrically uncoupled from the output. The voltage conveyor may control the voltage transition such that the voltage transitions without discontinuities. In other embodiments, the voltage may transition monotonically.

Abstract: A method and apparatus for driving a current switch with a differential drive signal monitors both the temperature of the switch and the current through the switch. The method and apparatus dynamically control the amplitude of the drive signal as a function of the switch temperature and the current through the switch. The result is a significant reduction in base drive amplitude without compromise to offset and linearity performance of the driver. The resulting dynamic performance of the switch is substantially improved.

Abstract: Transmission loss compensation is provided for receiver circuits in general, including an ATE receiver circuit having a voltage-to-current converter, such as a transconductance amplifier, that receives a distorted DUT signal and provides an output to a current-to-voltage converter, such as a transimpedance amplifier. The compensation circuit injects a compensation current into the current-to-voltage converter to compensate for transmission losses. The compensation circuit can be configured to inject a plurality of transient compensation currents with different respective time constants and peak values.

Abstract: A common-mode detector includes a first difference amplifier that is connected to compare a first input voltage with a feedback voltage to provide a first result, a second difference amplifier that is connected to compare a second input voltage with the feedback voltage to provide a second result, and a feedback amplifier that is connected to drive the feedback voltage to a level that is substantially the average of the first and second input voltages in response to receiving the first and second results.

Abstract: A complementary waveform driver is disclosed that generates output signals SOUT with arbitrary high and low drive states with respect to an independently controlled baseline signal SBL. Accordingly, the driver can generate very fast and flexible waveforms with multiple levels and baseline components. The driver implements complementary differential pairs of transistors that alternately source and sink programmable currents to an output port, creating an output waveform with excellent rising and falling edge symmetry, and greatly improved fidelity, especially at low level voltage swings. A complementary amplifier stage defines the baseline voltage level. When combined with a programmable active load and window comparator, the driver is particularly suited for pin electronics in automatic test equipment (ATE) applications.