Abstract: A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few simple parameters may need to be entered such as output characteristics and the process material dielectric constant.

Abstract: Many parts of the world have anti personnel (AP) landmines (APLs) buried in their earth, which pose a great deal not only to fighting forces, but also to civilians. For any imaging system, detection of APLs is non trivial since APLs are typically relatively small, compact objects that are buried in a similarly dense medium, such as earth. Improved explosive device (IED) detection may prove to have more potential than detection of APLs in view of the increasing worldwide terrorist activity. A portable APL or IED detection apparatus is thus proposed that utilized a coded aperture mask as well as a radiation source in order to detect backscatter radiation from a target area for use in assessing whether the target area includes an APL or an IED. The coded aperture mask receives the backscatter radiation and forms an image on a detector array, this formed image is deconvolved with a response matrix of the coded aperture mask in order to form a visual representation of the target area.

Abstract: A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few simple parameters may need to be entered such as output characteristics and the process material dielectric constant.

Abstract: A time domain reflectometry measuring instrument uses a microprocessor that provides added functionality and capabilities. The circuit electronics and probe are tested and calibrated at the factory. Installation and commissioning by the user is simple. The user installs the probe. The transmitter is attached to the probe. The user connects a standard shielded twisted pair to the electronics. Power is applied and the device immediately displays levels. A few simple parameters may need to be entered such as output characteristics and the process material dielectric constant.