Abstract: A method for storing memory test information includes the steps of storing a portion of information related to locations and numbers of failed memory cells detected while testing memory, and updating the stored information as failed memory cells are detected to indicate a first type of memory spare is to be assigned to repair a failed memory cell, a second complementary type of memory spare is to be assigned to repair the failed memory cell, or the memory is not repairable. The first type of memory spare corresponds to one of a row and a column portion of memory and the second complementary type of memory spare corresponds to the other of the row and column portions of memory.

Abstract: Methods and apparatus for storing memory test information are presented. The method includes the steps of storing a portion of information related to locations and numbers of failed memory cells detected while testing memory, and updating the stored information as failed memory cells are detected to indicate a first type of memory spare is to be assigned to repair a failed memory cell, a second complementary type of memory spare is to be assigned to repair the failed memory cell, or the memory is not repairable. The first type of memory spare corresponds to one of a row and a column portion of memory and the second complementary type of memory spare corresponds to the other of the row and column portions of memory.

Abstract: Methods and apparatus for analyzing and repairing memory are presented. The method includes the step of determining if failed memory cells detected in at least a portion of memory must be repaired using only one of a number of types of memory spares or may be repaired using any of the number of types of memory spares. Failed memory cells that must be repaired using only one of the number of types of memory spares are repeatedly repaired, skipping any failed memory cells that may be repaired using any of the number of types of memory spares, until either no new errors that must be repaired are repaired and no failed memory cells are skipped or the memory is determined to not be repairable. At least one of any failed memory cells skipped when repairing failed memory cells that must be repaired is repaired. The steps of determining if failed memory cells must be repaired and repeatedly repairing failed memory cells that must be repaired are repeated whenever at least one skipped failed memory cell is repaired.