Abstract: Probe systems for testing a device under test are disclosed herein. The probe systems include a platen that defines an upper surface, an opposed lower surface, and a platen aperture. The probe systems also include a chuck that defines a support surface configured to support a device under test. The probe systems further include a lower enclosure extending from the lower surface of the platen and an upper enclosure extending from the upper surface of the platen. The upper enclosure includes a side wall that defines a side wall aperture, and the side wall and the platen define an intersection angle of at least 30 degrees and at most 60 degrees. The probe systems also include a manipulator, a probe shaft arm, a probe assembly, a test head, and an electrical conductor.

Abstract: Techniques and systems for collaborative document editing and generating feedback on draft documents are described. A draft document is shared with multiple readers in a file format that is the same or similar to the file format in which the document will be published. The readers provide comments on the draft document. The comments can be stored in the same file as the document. Feedback may be solicited from a reader based on reading activity while interacting with the document.

Abstract: Probe systems for testing a device under test are disclosed herein. The probe systems include a platen that defines an upper surface, an opposed lower surface, and a platen aperture. The probe systems also include a chuck that defines a support surface configured to support a device under test. The probe systems further include a lower enclosure extending from the lower surface of the platen and an upper enclosure extending from the upper surface of the platen. The upper enclosure includes a side wall that defines a side wall aperture, and the side wall and the platen define an intersection angle of at least 30 degrees and at most 60 degrees. The probe systems also include a manipulator, a probe shaft arm, a probe assembly, a test head, and an electrical conductor.

Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck. The chuck includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.

Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck.

Abstract: A chuck that includes an upper surface for supporting a device under test and a conductive element that extends through the chuck to the upper surface of the chuck. The conductive element is electrically isolated from the upper surface of the chuck, and makes electrical contact with any device under test supported by the chuck.

Abstract: A probe station for testing a device under test. A first platen supporting an electrical probe. A chuck supporting the device under test. A second platen supporting an optical probe. The first platen and the second platen positioned above the device under test. A percentage of the top surface of the second platen terminating into free space.

Abstract: A probe station.

Abstract: Devices and methods for controlling an animal are disclosed. An animal control device includes a retractable leash assembly for being mounted to a collar or other harness. The retractable leash assembly has a retractable leash that is extendable from and retractable back to the collar via the retractable leash assembly. The retractable leash assembly includes a spool in a housing. The retractable leash is adapted to be wound around the spool in a retracted mode, and extendable from the spool in an extended mode.

Abstract: Devices and methods for controlling an animal are disclosed. An animal control device includes a retractable leash assembly for being mounted to a collar or other harness. The retractable leash assembly has a retractable leash that is extendable from and retractable back to the collar via the retractable leash assembly. The retractable leash assembly includes a spool in a housing. The retractable leash is adapted to be wound around the spool in a retracted mode, and extendable from the spool in an extended mode.

Abstract: A probe station.

Abstract: A chuck includes a conductive element that contacts a device under test in a location on the chuck.

Abstract: A probe station.               ABSTRACT IS TOO SHORT. We have to do something to make this paragraph longer so that Xyvision will allow us to print it out so I am adding some 50 extra words so that it will hopefully let us print it out so that we can proof the file. PLEASE REMOVE THIS EXTRA DATA.

Abstract: A probe station.