Abstract: A system for analyzing the behavior of electronic devices includes a first database for storing simulation values and a second database for storing actual waveform values. The system further includes software for aligning the values stored in the first and second databases, so that simulated and actual values can be readily compared. Analysis tools are included for examining similarities and differences between simulated and actual behavior.

Abstract: A system for analyzing the behavior of electronic devices includes a first database for storing simulation values and a second database for storing actual waveform values. The simulation values include test patterns representing inputs to a device model, response data representing outputs from the device model, and expect data representing expected values of the response data in response to the test patterns. The actual waveform values include sampled inputs and outputs of an actual device under test (DUT), of the type presented by the model, and acquired using an electronic test system. When the DUT is exercised with test patterns that correspond to the test patterns stored in the first database, the DUT generates output that can be compared directly with the response data and/or expect data stored in the first database. The system according to the invention further includes software for aligning the data stored in the first and second databases, so that simulated and actual values can be readily compared.