Abstract: This invention relates to a semiconductor device for testing and analyzing integrated circuits (1) on a first side and a second side. The semiconductor device (1) having a first surface (A1) and a second surface (A2) both sides having a set of contacts (P3a, P3b, P3a?, P3b?). The sets of contacts on are symmetrically located on positions relative to a first fictitious plane of symmetry (S1) and a second fictitious plane of symmetry (S2). The semiconductor device (1) has at least a first position of use and a second position of use, whereby the second position of use is obtained by rotating the semiconductor device (1) in the first position of use 180° around a fictitious axis (M). This axis (M) is defined by the crossing of the first fictitious plane of symmetry (S1) and the second fictitious plane of symmetry (S2). The semiconductor device thus obtained provides a flexible and generic solution for testing and analyzing integrated circuits on both sides.

Abstract: This invention relates to a semiconductor device for testing and analyzing integrated circuits (1) on a first side and a second side. The semiconductor device (1) having a first surface (A1) and a second surface (A2) both sides having a set of contacts (P3a, P3b, P3a?, P3b?). The sets of contacts on are symmetrically located on positions relative to a first fictitious plane of symmetry (S1) and a second fictitious plane of symmetry (S2). The semiconductor device (1) has at least a first position of use and a second position of use, whereby the second position of use is obtained by rotating the semiconductor device (1) in the first position of use 180° around a fictitious axis (M). This axis (M) is defined by the crossing of the first fictitious plane of symmetry (S1) and the second fictitious plane of symmetry (S2). The semiconductor device thus obtained provides a flexible and generic solution for testing and analyzing integrated circuits on both sides.