Patents by Inventor Anthony W. Fazekas

Anthony W. Fazekas has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Design structure for couple noise characterization using a single oscillator
    Patent number: 8095902
    Abstract: A design structure for a computer-aided design system for generating a functional design model of an integrated circuit design (having nets comprising wires) determines critical parameters for coupling noise between the wires of the nets and acceptable limits for the critical parameters. Further, methods herein include designing a ring oscillator to have stages, each of the stages measuring only one of the critical parameters. This ring oscillator is then included within an integrated circuit design and associated design structure. The embodiments herein produce an integrated circuit according to this integrated circuit design and operate the ring oscillator within the integrated circuit to measure the critical parameters of the integrated circuit and produce test results. These test results are output to determine whether the test results are within the acceptable limits.
    Type: Grant
    Filed: August 18, 2008
    Date of Patent: January 10, 2012
    Assignee: International Business Machines Corporation
    Inventors: Anthony W. Fazekas, Kenneth Mon Ngai, Joseph J. Oler, Jr.
  • Structure for couple noise characterization using a single oscillator
    Patent number: 7958471
    Abstract: A design structure for a computer-aided design system for generating a functional design model of an integrated circuit design (having nets comprising wires) determines critical parameters for coupling noise between the wires of the nets and acceptable limits for the critical parameters. Further, methods herein include designing a ring oscillator to have stages, each of the stages measuring only one of the critical parameters. This ring oscillator is then included within an integrated circuit design and associated design structure. The embodiments herein produce an integrated circuit according to this integrated circuit design and operate the ring oscillator within the integrated circuit to measure the critical parameters of the integrated circuit and produce test results. These test results are output to determine whether the test results are within the acceptable limits.
    Type: Grant
    Filed: August 18, 2008
    Date of Patent: June 7, 2011
    Assignee: International Business Machines Corporation
    Inventors: Anthony W. Fazekas, Kenneth Mon Ngai, Joseph J. Oler, Jr.
  • Structure for Couple Noise Characterization Using a Single Oscillator
    Publication number: 20100042962
    Abstract: A design structure for a computer-aided design system for generating a functional design model of an integrated circuit design (having nets comprising wires) determines critical parameters for coupling noise between the wires of the nets and acceptable limits for the critical parameters. Further, methods herein include designing a ring oscillator to have stages, each of the stages measuring only one of the critical parameters. This ring oscillator is then included within an integrated circuit design and associated design structure. The embodiments herein produce an integrated circuit according to this integrated circuit design and operate the ring oscillator within the integrated circuit to measure the critical parameters of the integrated circuit and produce test results. These test results are output to determine whether the test results are within the acceptable limits.
    Type: Application
    Filed: August 18, 2008
    Publication date: February 18, 2010
    Inventors: Anthony W. Fazekas, Kenneth Mon Ngai, Joseph J. Oler, JR.
  • Structure for Couple Noise Characterization Using a Single Oscillator
    Publication number: 20100042960
    Abstract: A design structure for a computer-aided design system for generating a functional design model of an integrated circuit design (having nets comprising wires) determines critical parameters for coupling noise between the wires of the nets and acceptable limits for the critical parameters. Further, methods herein include designing a ring oscillator to have stages, each of the stages measuring only one of the critical parameters. This ring oscillator is then included within an integrated circuit design and associated design structure. The embodiments herein produce an integrated circuit according to this integrated circuit design and operate the ring oscillator within the integrated circuit to measure the critical parameters of the integrated circuit and produce test results. These test results are output to determine whether the test results are within the acceptable limits.
    Type: Application
    Filed: August 18, 2008
    Publication date: February 18, 2010
    Inventors: Anthony W. Fazekas, Kenneth Mon Ngai, Joseph J. Oler, JR.