Abstract: A method for configuring a target spectrometry device using a reference spectrometry device. The method involves: acquiring spectral measurements for a set of reference samples with the reference spectrometer and storing the spectral measurements in a reference database; acquiring target spectral measurements for a sub-set of reference samples with the target spectrometer and storing the spectral measurements in a target database; determining an average spectrum for each reference sample from the reference and target spectral measurements; determining a series of spectra for each average spectrum, which includes determining an optical transfer function of the target spectrometer and applying the optical transfer function to each average spectrum measured by the reference spectrometer; and storing the average spectrum and series of spectra of each reference sample in the target database. The determining steps use a computing module. Also, a spectrometry device configured for the method.

Abstract: The invention relates to a characterization device (50) for characterizing a sample (S) comprising: a memory (MEM) storing a measured spectrum (As+p) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (Ap), a processing unit (PU) configured to: determine a spectral energy (Es+p) of the measured spectrum (As+p) of the sample through the translucent material (As+p), estimate a coefficient ({circumflex over (?)}) from said spectral energy (Es+p) and, determine a corrected spectrum (Âs) of the sample from the measured spectrum (As+p) of the sample through the translucent material and from a corrected spectrum of the translucent material (Âp), said corrected spectrum of the translucent material (Âp) being determined from the measured spectrum of the translucent material (Ap) and from the estimated coefficient ({circumflex over (?)}).

Abstract: The invention relates to a characterization device (50) for characterizing a sample (S) comprising: a memory (MEM) storing a measured spectrum (As+p) of said sample, performed through a translucent material, and a measured spectrum of the translucent material (Ap), a processing unit (PU) configured to: determine a spectral energy (Es+p) of the measured spectrum (As+p) of the sample through the translucent material (As+p), estimate a coefficient ({circumflex over (?)}) from said spectral energy (Es+p) and, determine a corrected spectrum (Âs) of the sample from the measured spectrum (As+p) of the sample through the translucent material and from a corrected spectrum of the translucent material (Âp), said corrected spectrum of the translucent material (Âp) being determined from the measured spectrum of the translucent material (Ap) and from the estimated coefficient ({circumflex over (?)}).