Patents by Inventor Antoine Touboul

Antoine Touboul has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measurement of radiations of high influence by a capacitive element of MOS type
    Patent number: 8981308
    Abstract: A method for measuring a dose related to the non-ionizing effects of a radiation of particles comprises the irradiation of a capacitive element provided with an electrode made from a semiconductor material, the measurement of the capacitance of the capacitive element in an accumulation regime and the determination of the dose related to the non-ionizing effects from the measurement of capacitance of the capacitive element in the accumulation regime.
    Type: Grant
    Filed: January 31, 2012
    Date of Patent: March 17, 2015
    Assignee: Universite Montpellier 2 Sciences et Techniques
    Inventors: Richard Arinero, Julien Mekki, Antoine Touboul, Frederic Saigne, Jean-Roch Vaille
  • MEASUREMENT OF RADIATIONS OF HIGH INFLUENCE BY A CAPACITIVE ELEMENT OF MOS TYPE
    Publication number: 20140034841
    Abstract: A method for measuring a dose related to the non-ionizing effects of a radiation of particles comprises the irradiation of a capacitive element provided with an electrode made from a semiconductor material, the measurement of the capacitance of the capacitive element in an accumulation regime and the determination of the dose related to the non-ionizing effects from the measurement of capacitance of the capacitive element in the accumulation regime.
    Type: Application
    Filed: January 31, 2012
    Publication date: February 6, 2014
    Applicant: UNIVERSITE MONTPELLIER 2 SCIENCES ET TECHNIQUES
    Inventors: Richard Arinero, Julien Mekki, Antoine Touboul, Frederic Saigne, Jean-Roch Vaille