Abstract: Systems and methods for depth measurement are described herein. A depth measurement device may comprise a first light source configured to direct a first beam of light, a second light source configured to direct a second beam of light, and a mirror. The mirror may be for viewing at least one of the first beam of light and the second beam of light. The depth measurement device may further comprise a housing. The depth measurement device may further comprise an eyepiece. The first beam of light and the second beam of light may be configured to intersect at a desired location. The eyepiece may be configured to maintain a consistent line-of-sight between the eyepiece, the mirror, and the desired location. In various embodiments, the second beam of light may be oriented at an acute angle with respect to the first beam of light.

Abstract: Systems and methods for depth measurement are described herein. A depth measurement device may comprise a first light source configured to direct a first beam of light, a second light source configured to direct a second beam of light, and a mirror. The mirror may be for viewing at least one of the first beam of light and the second beam of light. The depth measurement device may further comprise a housing. The depth measurement device may further comprise an eyepiece. The first beam of light and the second beam of light may be configured to intersect at a desired location. The eyepiece may be configured to maintain a consistent line-of-sight between the eyepiece, the mirror, and the desired location. In various embodiments, the second beam of light may be oriented at an acute angle with respect to the first beam of light.

Abstract: Disclosed are foot coverings 20 for collecting debris D from walking surfaces S. The foot coverings 20 include an upper portion 22 connected to a lower sole 24. The sole 24 includes a magnet 38 attached to an arch segment 30 of the sole 24. A magnet collection surface 40 is exposed to the debris D.

Abstract: To enable the on-machine measurement of selected features of a workpiece formed on a live spindle lathe with a positioning rotary table, both the machine itself and the electronic touch probe used to conduct the measurements are calibrated. The accuracy of the machine itself is measured and calculated by including the measured errors not only in the x and z linear axes, but also in the y linear axis. Calibration of the touch probe is made by determining a correction factor which is obtained by the touch probe measurement of an artifact whose dimensions are precisely known by other means. This correction factor is then made to the nominal measurements made by the touch probe on the selected features of the workpiece to be measured, to obtain the actual dimensions thereof. Adjustments are also made to compensate for the differences in radial positions between the workpiece and the artifact.

Abstract: To enable the on-machine measurement of selected features of a workpiece formed on a live spindle lathe with a positioning rotary table, both the machine itself and the electronic touch probe used to conduct the measurements are calibrated. The accuracy of the machine itself is measured and calculated by including the measured errors not only in the x and z linear axes, but also in the y linear axis. Calibration of the touch probe is made by determining a correction factor which is obtained by the touch probe measurement of an artifact whose dimensions are precisely known by other means. This correction factor is then made to the nominal measurements made by the touch probe on the selected features of the workpiece to be measured, to obtain the actual dimensions thereof. Adjustments are also made to compensate for the differences in radial positions between the workpiece and the artifact.