Patents by Inventor Anton Evgeniyevich Efimov

Anton Evgeniyevich Efimov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning probe microscope combined with a device for modifying the surface of an object
    Patent number: 10054613
    Abstract: The microscope for monitoring objects after nano-cutting and for investigating structures of macro- and micro-carriers under low temperature comprises a punch having a cutting edge, drives driving the punch along two axes, a platform rotatable in a plane, a piezo-scanner for recording a sample image along three axes, a holder with a carrier of the sample, and a probe unit to which a probe is fastened. The piezo-scanner is fastened to the platform, the punch is able to interact with the sample, and the probe unit is mounted on the platform so as to be movable along one of the axes. The assembly includes a module for mechanical action on the cutting edge of the punch to modify the cutting surface, which module is fastened to the same platform to which the piezo-scanner with the object carrier and the probe unit are fastened.
    Type: Grant
    Filed: July 10, 2015
    Date of Patent: August 21, 2018
    Assignee: PRIVATE INSTITUTION “NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM”
    Inventors: Alexander Alekseev, Aleksey Dmitriyevich Volkov, Dmitry Yuryevich Sokolov, Anton Evgeniyevich Efimov
  • SCANNING PROBE MICROSCOPE COMBINED WITH A DEVICE FOR MODIFYING THE SURFACE OF AN OBJECT
    Publication number: 20170350921
    Abstract: The microscope for monitoring objects after nano-cutting and for investigating structures of macro- and micro-carriers under low temperature comprises a punch having a cutting edge, drives driving the punch along two axes, a platform rotatable in a plane, a piezo-scanner for recording a sample image along three axes, a holder with a carrier of the sample, and a probe unit to which a probe is fastened. The piezo-scanner is fastened to the platform, the punch is able to interact with the sample, and the probe unit is mounted on the platform so as to be movable along one of the axes. The assembly includes a module for mechanical action on the cutting edge of the punch to modify the cutting surface, which module is fastened to the same platform to which the piezo-scanner with the object carrier and the probe unit are fastened.
    Type: Application
    Filed: July 10, 2015
    Publication date: December 7, 2017
    Applicant: PRIVATE INSTITUTION "NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM"
    Inventors: Alexander Alekseev, Aleksey Dmitriyevich Volkov, Dmitry Yuryevich Sokolov, Anton Evgeniyevich Efimov