Patents by Inventor Anton S. Khomenko

Anton S. Khomenko has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning interferometry technique for through-thickness evaluation in multi-layered transparent structures
    Patent number: 9500468
    Abstract: A multi-layer transparent composite detection technique includes producing two beams from a single, low-coherence source, a test beam and a reference beam, and scanning the reference beam to determine, with high precision, the depths of flaws (e.g., delaminations, bubbles, inclusions or other reflective or scattering objects) within a specimen or test object. The techniques combine light back-reflected or back-scattered from an internal flaw or interface with light in a reference path to identify such features and locations.
    Type: Grant
    Filed: August 24, 2015
    Date of Patent: November 22, 2016
    Assignee: BOARD OF TRUSTEES OF MICHIGAN STATE UNIVERSITY
    Inventors: Anton S. Khomenko, Mahmoodul Haq, Gary L. Cloud
  • Scanning interferometry technique for through-thickness evaluation in multi-layered transparent structures
    Publication number: 20160054116
    Abstract: A multi-layer transparent composite detection technique includes producing two beams from a single, low-coherence source, a test beam and a reference beam, and scanning the reference beam to determine, with high precision, the depths of flaws (e.g., delaminations, bubbles, inclusions or other reflective or scattering objects) within a specimen or test object. The techniques combine light back-reflected or back-scattered from an internal flaw or interface with light in a reference path to identify such features and locations.
    Type: Application
    Filed: August 24, 2015
    Publication date: February 25, 2016
    Inventors: Anton S. Khomenko, Mahmoodul Haq, Gary L. Cloud