Abstract: An electronic testing system may use a gas phase heat transfer medium to cool components of the system and devices under test within the system. The heat transfer medium may be clean dry air, or other gas phase compounds.

Abstract: A carrier assembly may include a carrier comprising a coupon receptacle configured to engage therein a coupon, the coupon having a device pocket to retain therein a device under test (DUT) during electrical testing thereof and having one or more bottom openings for the DUT to contact a contactor during the electrical testing. A carrier assembly may include a plurality of elastic members configured to be independently elastically elongated to adjust a position of the coupon in the coupon receptacle into a testing position in which the DUT makes electrical and physical contact with the contactor.

Abstract: An automated test system for testing singulated electronic components comprises a handler, comprising a plurality of handler pickers and/or spinner pickers, the handler pickers and/or spinner pickers being adapted to each pickup one electronic component, at least one processing station for processing one of the electronic components, a first carrier, a second carrier, and a test unit, for testing singulated electronic components located on a carrier. When the second plurality of electronic components on the second carrier are tested in the test unit while the second plurality of electronic components rest on the second carrier, simultaneously the first carrier is loaded with the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers and/or unloaded from the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers.

Abstract: An automated test system for testing singulated electronic components comprises a handler, comprising a plurality of handler pickers and/or spinner pickers, the handler pickers and/or spinner pickers being adapted to each pickup one electronic component, at least one processing station for processing one of the electronic components, a first carrier, a second carrier, and a test unit, for testing singulated electronic components located on a carrier. When the second plurality of electronic components on the second carrier are tested in the test unit while the second plurality of electronic components rest on the second carrier, simultaneously the first carrier is loaded with the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers and/or unloaded from the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers.

Abstract: A sound test device for testing a DUT in particular a MEMS microphone, comprises a sound chamber a socket unit and a sound generator unit, wherein the sound generator unit includes a speaker comprising a speaker membrane, an opening, and a reference microphone comprising a microphone membrane wherein the opening is adapted to receive a DUT opening of the DUT and wherein the microphone membrane and the opening are arranged to opposing each other, and the socket unit includes the at least one contact element being adapted to contact to a contact terminal of the DUT, and wherein the sound chamber is limited by the speaker membrane, the microphone membrane, and the opening.

Abstract: A test module for testing microphones comprises an outer chamber being airtight, and a sound chamber comprising an electrical test device for testing the microphones. The sound chamber is located within the outer chamber, and the sound chamber is coupled to the outer chamber with a connection suppressing structure-borne noise between the outer chamber and the sound chamber. A space between the outer chamber and the sound chamber has a gas pressure being lower than an ambient air pressure. A method of testing microphones comprises evacuating the space between the outer chamber and the sound chamber to having a lower gas pressure than an ambient air pressure, and testing the microphone.

Abstract: An automated test system for testing singulated electronic components comprises a handler, comprising a plurality of handler pickers and/or spinner pickers, the handler pickers and/or spinner pickers being adapted to each pickup one electronic component, at least one processing station for processing one of the electronic components, a first carrier, a second carrier, and a test unit, for testing singulated electronic components located on a carrier. When the second plurality of electronic components on the second carrier are tested in the test unit while the second plurality of electronic components rest on the second carrier, simultaneously the first carrier is loaded with the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers and/or unloaded from the first plurality of electronic components by the plurality of handler pickers and/or spinner pickers.

Abstract: A test module for testing microphones comprises an outer chamber being airtight, and a sound chamber comprising an electrical test device for testing the microphones. The sound chamber is located within the outer chamber, and the sound chamber is coupled to the outer chamber with a connection suppressing structure-borne noise between the outer chamber and the sound chamber. A space between the outer chamber and the sound chamber has a gas pressure being lower than an ambient air pressure. A method of testing microphones comprises evacuating the space between the outer chamber and the sound chamber to having a lower gas pressure than an ambient air pressure, and testing the microphone.