Patents by Inventor Anton V. Ievlev

Anton V. Ievlev has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11355336
    Abstract: A method of performing time-of-flight secondary ion mass spectrometry on a sample includes the step of directing a beam of primary ions to the sample, and stimulating the migration of ions within the sample while the beam of primary ions is directed at the sample. The stimulation of the ions is cycled between a stimulation state and a lower stimulation state. Secondary ions emitted from the sample by the beam of primary ions are collected in a time-of-flight mass spectrometer. Time-of-flight secondary ion mass spectrometry is then performed on the secondary ions. A system for performing time-of-flight secondary ion mass spectrometry on a sample is also disclosed.
    Type: Grant
    Filed: February 12, 2021
    Date of Patent: June 7, 2022
    Assignees: UT-BATTELLE, LLC, UNIVERSITY OF TENNESSEE RESEARCH FOUNDATION
    Inventors: Anton V. Ievlev, Olga S. Ovchinnikova, Matthias Lorenz, Yongtao Liu
  • Patent number: 11313878
    Abstract: Techniques for generating full-spatial resolution, full spectral resolution image(s) from a 3D spectral-data cube for any spectral value within a given spectral range are provided without requiring the acquisition of all full-spatial resolution, full spectral resolution data by an instrument. The 3D spectral-data cube is generated from a limited number of full-spatial resolution, sparse spectral resolution data and a sparse-spatial resolution, full-spectral resolution data of the same area of the sample. The use of the 3D spectral-data cube reduces the data acquisition time.
    Type: Grant
    Filed: April 16, 2021
    Date of Patent: April 26, 2022
    Assignee: UT-BATTELLE, LLC
    Inventors: Olga S. Ovchinnikova, Nikolay Borodinov, Anton V. Ievlev, Sergei V. Kalinin, Rama K. Vasudevan
  • Publication number: 20210384021
    Abstract: Machine learning approach can combine mass spectral imaging (MSI) techniques, one with low spatial resolution but intact molecular spectra and the other with nanometer spatial resolution but fragmented molecular signatures, to predict molecular MSI spectra with submicron spatial resolution. The machine learning approach can perform transformations on the spectral image data of the two MSI techniques to reduce dimensionality, and using a correlation technique, find relationships between the transformed spectral image data. The determined relationships can be used to generate MSI spectra of desired resolution.
    Type: Application
    Filed: June 3, 2021
    Publication date: December 9, 2021
    Inventors: Olga S. Ovchinnikova, Anton V. Ievlev, Matthias Lorenz, Nikolay Borodinov, Steven T. King
  • Publication number: 20210325428
    Abstract: Techniques for generating full-spatial resolution, full spectral resolution image(s) from a 3D spectral-data cube for any spectral value within a given spectral range are provided without requiring the acquisition of all full-spatial resolution, full spectral resolution data by an instrument. The 3D spectral-data cube is generated from a limited number of full-spatial resolution, sparse spectral resolution data and a sparse-spatial resolution, full-spectral resolution data of the same area of the sample. The use of the 3D spectral-data cube reduces the data acquisition time.
    Type: Application
    Filed: April 16, 2021
    Publication date: October 21, 2021
    Inventors: Olga S. Ovchinnikova, Nikolay Borodinov, Anton V. Ievlev, Sergei V. Kalinin, Rama K. Vasudevan
  • Publication number: 20210257205
    Abstract: A method of performing time-of-flight secondary ion mass spectrometry on a sample includes the step of directing a beam of primary ions to the sample, and stimulating the migration of ions within the sample while the beam of primary ions is directed at the sample. The stimulation of the ions is cycled between a stimulation state and a lower stimulation state. Secondary ions emitted from the sample by the beam of primary ions are collected in a time-of-flight mass spectrometer. Time-of-flight secondary ion mass spectrometry is then performed on the secondary ions. A system for performing time-of-flight secondary ion mass spectrometry on a sample is also disclosed.
    Type: Application
    Filed: February 12, 2021
    Publication date: August 19, 2021
    Inventors: Anton V. Ievlev, Olga D. Ovchinnikova, Matthias Lorenz, Yongtao Liu