Patents by Inventor Antonio Critelli

Antonio Critelli has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dimensional measurement method and reference sample for carrying out the method
    Patent number: 5581012
    Abstract: A method for the dimensional measurement of a piece to be checked is disclosed, wherein a comparison sample and a reference sample are employed, respectively of a material which is coherent with that of the piece to be checked and of a material having a low thermal expansion coefficient. Through the comparison between the two samples the relative thermal expansion is determined, and same is then related to the measurements carried out on the piece to be checked so as to determine the dimensions thereof as if the measurement were performed in a controlled temperature environment. The reference sample for carrying out the method is preferably made of a composite material.
    Type: Grant
    Filed: December 2, 1994
    Date of Patent: December 3, 1996
    Assignee: Rosfer Engineering Sas di Critelli Antonio e C.
    Inventor: Antonio Critelli