Patents by Inventor Antonio E. Ginart

Antonio E. Ginart has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life
    Patent number: 8600685
    Abstract: Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.
    Type: Grant
    Filed: December 23, 2011
    Date of Patent: December 3, 2013
    Assignee: Sikorsky Aircraft Corporation
    Inventors: Patrick W. Kalgren, Antonio E. Ginart, Shashank Nanduri, Anthony J. Boodhansingh, Carl S. Byington, Rolf Orsagh, Brian Sipos, Douglas W. Brown
  • SYSTEMS AND METHODS FOR PREDICTING FAILURE OF ELECTRONIC SYSTEMS AND ASSESSING LEVEL OF DEGRADATION AND REMAINING USEFUL LIFE
    Publication number: 20120191384
    Abstract: Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.
    Type: Application
    Filed: December 23, 2011
    Publication date: July 26, 2012
    Applicant: Impact Technologies, LLC
    Inventors: Patrick W. Kalgren, Antonio E. Ginart, Shashank Nanduri, Anthony J. Boodhansingh, Carl S. Byington, Rolf Orsagh, Brian J. Sipos, Douglas W. Brown
  • Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life
    Patent number: 8103463
    Abstract: Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.
    Type: Grant
    Filed: September 21, 2007
    Date of Patent: January 24, 2012
    Assignee: Impact Technologies, LLC
    Inventors: Patrick W. Kalgren, Antonio E. Ginart, Sashank Nanduri, Anthony J. Boodhansingh, Carl S. Byington, Rolf F. Orsagh, Brian J. Sipos, Douglas W. Brown, Christopher M. Minnella, Mark Baybutt
  • SYSTEMS AND METHODS FOR PREDICTING FAILURE OF ELECTRONIC SYSTEMS AND ASSESSING LEVEL OF DEGRADATION AND REMAINING USEFUL LIFE
    Publication number: 20080141072
    Abstract: Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.
    Type: Application
    Filed: September 21, 2007
    Publication date: June 12, 2008
    Applicant: Impact Technologies, LLC
    Inventors: Patrick W. Kalgren, Antonio E. Ginart, Sashank Nanduri, Anthony J. Boodhansingh, Carl S. Byington, Rolf F. Orsagh, Douglas W. Brown, Brian J. Sipos, Christopher M. Minnella, Mark Baybutt