Patents by Inventor Antonios E. Giannakopoulos

Antonios E. Giannakopoulos has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6641893
    Abstract: An article is provided that is highly resistant to localized normal indentation, or indentation tensile stresses, against its surface. The article is a stacked array of at least five layer units each having local anisotropy in at least one direction. Each unit has an adjacent unit that differs in a mechanical property, or offset in principle axis of anisotropy by less than 45°. The article forms part of a construction constructed and positioned to withstand indentation, or contact damage, detrimental to its use having a component normal to any tangent of the surface. The article can be a stacked array of fiber-reinforced polymeric material, i.e., prepreg, with the fiber direction offset from each layer to the next by less than 45°. Methods of making the article and methods of use of the article to resist impact are provided. Also provided are articles having surfaces, the surfaces being constructed and arranged to withstand sliding contact stress.
    Type: Grant
    Filed: April 20, 1998
    Date of Patent: November 4, 2003
    Assignees: Massachusetts Institute of Technology, University of Connecticut
    Inventors: Subra Suresh, Antonios E. Giannakopoulos, Marten Olsson, Rajendran Thampuran, Ole Jorgensen, Nitin P. Padture, Juthamas Jitcharoen
  • Patent number: 6247355
    Abstract: An indentation measurement apparatus is retrofittable onto any of a variety of load-applying frames and includes a mount for mounting an indenter of any geometry (for example blunt or sharp). The arrangement is very stiff and mechanical values including Young's modulus, strain hardening exponent, yield strength, and hardness can be obtained from a single load/unload versus displacement test. A wide variety of materials can be tested using the apparatus. An optical probe can measure displacement of the indenter head relative to a sample. A new method of calculating strain hardening directly from load/displacement measurement is presented as is a new method of calculating strain hardening exponent.
    Type: Grant
    Filed: February 19, 1998
    Date of Patent: June 19, 2001
    Assignee: Massachusetts Institute of Technology
    Inventors: Subra Suresh, Jorge Alcala, Antonios E. Giannakopoulos
  • Patent number: 6134954
    Abstract: An indentation measurement apparatus is retrofittable onto any of a variety of load-applying frames and includes a mount for mounting an indenter of any geometry (for example blunt or sharp). The arrangement is very stiff and mechanical values including Young's modulus, strain hardening exponent, yield strength, and hardness can be obtained from a single load/unload versus displacement test. A wide variety of materials can be tested using the apparatus. An optical probe can measure displacement of the indenter head relative to a sample. A new method of calculating strain hardening directly from load/displacement measurement is presented as is a new method of calculating strain hardening exponent.
    Type: Grant
    Filed: April 15, 1996
    Date of Patent: October 24, 2000
    Assignee: Massachusetts Institute of Technology
    Inventors: Subra Suresh, Jorge Alcala, Antonios E. Giannakopoulos
  • Patent number: 5999887
    Abstract: Techniques for the determination of mechanical properties of homogenous or functionally-graded materials from indentation testing are presented. The technique is applicable to indentation on the nano-scale through the macro-scale including the geological scale. The technique involves creating a predictive load/depth relationship for a sample, providing an experimental load/depth relationship, comparing the experimental data to the predictive data, and determining a physical characteristic from the comparison.
    Type: Grant
    Filed: February 26, 1997
    Date of Patent: December 7, 1999
    Assignee: Massachusetts Institute of Technology
    Inventors: Antonios E. Giannakopoulos, Subra Suresh