Patents by Inventor Antonius Van Lier

Antonius Van Lier has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070098264
    Abstract: The method of analyzing an object contour image (100), useful for fast object detection based on contour matching comprises: specifying a scan path (306) of positions (xR, yR) in the contour image (100) of a region of interest (303), for processing substantially all pixels of contour image (100); constructing a first table (111) containing for each pixel in the contour image (100) of non-zero value at least one position coordinate (x); constructing a fourth table (311) corresponding to a position of the region of interest (303), containing at least for each parallel line of pixels traversing the region of interest (303), an index (312) of an entry (121) in the first table (111), of, given a scan direction, the first non zero pixel of the contour image (100) lying on the respective parallel line and being inside the region of interest (303); and constructing a fifth table (313) corresponding to a position of the region of interest (303), containing at least for each parallel line of pixels traversing the regio
    Type: Application
    Filed: October 12, 2004
    Publication date: May 3, 2007
    Inventors: Antonius Van Lier, Hong Liu, Cristina Nicolescu, Marinus Van Leeuwen