Abstract: Disclosed is a method for inspecting a food product, the method includes: receiving image data representing the food product captured with an X-ray imaging unit; performing a texture analysis to image data for generating a first set of detections; performing a pattern analysis to at least part of the image data, the pattern analysis performed with a machine-learning component trained to identify objects with predefined pattern, for generating a second set of detections; generating an indication of an outcome of an inspection of the food product in accordance with a combination of the generated first set of detections and the second set of detections. Also disclosed is an apparatus and a computer program product.

Abstract: Disclosed is a method for inspecting a food product, the method includes: receiving image data representing the food product captured with an X-ray imaging unit; performing a texture analysis to image data for generating a first set of detections; performing a pattern analysis to at least part of the image data, the pattern analysis performed with a machine-learning component trained to identify objects with predefined pattern, for generating a second set of detections; generating an indication of an outcome of an inspection of the food product in accordance with a combination of the generated first set of detections and the second set of detections. Also disclosed is an apparatus and a computer program product.

Abstract: A digital phosphor spectrum analyzer (DPSA) uses a fast rasterization and decay process to emulate the look and feel of an analog phosphor display while improving the ratio of waveform acquisition to non-acquisition time. Multiple acquisitions of complex digital data for an input signal being analyzed across a frequency span are accumulated in a raster memory at a waveform update rate to produce a composite waveform. A decay function is applied to the composite waveform to produce a display waveform. The display waveform is viewed on a display device at a display update rate, resulting in the ability to see otherwise unobservable frequency characteristics of the input signal.