Patents by Inventor Anuj Doshi

Anuj Doshi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Artificial Intelligence Process Control for Assembly Processes
    Publication number: 20240029239
    Abstract: A manufacturing system is disclosed herein. The manufacturing system includes a monitoring platform and an analytics platform. The monitoring platform is configured to capture data of an operator during assembly of an article of manufacture. The monitoring platform includes one or more cameras and one or more microphones. The analytics platform is in communication with the monitoring platform. The analytics platform is configured to analyze the data captured by the monitoring platform.
    Type: Application
    Filed: July 18, 2023
    Publication date: January 25, 2024
    Applicant: Nanotronics Imaging, Inc.
    Inventors: Jonathan Lee, Anuj Doshi
  • System and Method for Generating Training Data Sets for Specimen Defect Detection
    Publication number: 20230394801
    Abstract: A system and method for generating a training data set for training a machine learning model to detect defects in specimens is described herein. A computing system cause presentation of an image on a device of a user. The image includes at least one defect on an example specimen. The computing system receives an annotated image from the user. The user annotated the image using an input via the device. The input includes a first indication of a location of the defect and a second indication of a class corresponding to the defect. The computing system adjusts the annotated image to standardize the input based on an error profile of the user and the class corresponding to the defect. The computing system uploads the annotated image for training the machine learning model.
    Type: Application
    Filed: August 14, 2023
    Publication date: December 7, 2023
    Applicant: Nanotronics Imaging, Inc.
    Inventors: Anuj Doshi, Jonathan Lee, John B. Putman
  • System and method for generating training data sets for specimen defect detection
    Patent number: 11727672
    Abstract: A system and method for generating a training data set for training a machine learning model to detect defects in specimens is described herein. A computing system cause presentation of an image on a device of a user. The image includes at least one defect on an example specimen. The computing system receives an annotated image from the user. The user annotated the image using an input via the device. The input includes a first indication of a location of the defect and a second indication of a class corresponding to the defect. The computing system adjusts the annotated image to standardize the input based on an error profile of the user and the class corresponding to the defect. The computing system uploads the annotated image for training the machine learning model.
    Type: Grant
    Filed: October 7, 2022
    Date of Patent: August 15, 2023
    Assignee: Nanotronics Imaging, Inc.
    Inventors: Anuj Doshi, Jonathan Lee, John B. Putman