Patents by Inventor Anuj Gupta

Anuj Gupta has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150031356
    Abstract: According to an implementation of the present subject matter, systems and methods for providing mobile connectivity to users while roaming, on a dynamic basis are described. The method includes receiving a location update message associated with a user latched to a secondary service provider, the user having a subscriber identity module (SIM) with a primary International Mobile Subscriber Identity (IMSI) number provided by a default service provider of the user, wherein the location update message is based on the primary IMSI number of the user. The method also includes generating a dummy location update message based on the received location update message and a secondary IMSI number associated with the secondary service provider; and sending the dummy location update message to the secondary service provider associated with the secondary IMSI number such that the user is provided communication services by the secondary service provider based on the primary IMSI number.
    Type: Application
    Filed: February 14, 2013
    Publication date: January 29, 2015
    Applicant: Alcatel Lucent
    Inventors: Anuj Gupta, Sushil Kumar Saini
  • Publication number: 20140379481
    Abstract: A computer implemented method and apparatus for targeting messages in desktop and mobile applications. The method comprises retrieving, on a user device, one or more policies for a software application; recording user behavior and application usage data during operation of the software application on the user device; determining whether one or more of said policies has been satisfied based on the recorded user behavior and application usage; and performing an action on the user device when it is determined that one or more of said policies has been satisfied.
    Type: Application
    Filed: June 19, 2013
    Publication date: December 25, 2014
    Inventors: Anuj Gupta, Anup, Manish Kasat, Neeraj Bagga
  • Publication number: 20130006992
    Abstract: During application of data quality rules to a data set obtained from a data source, data is retrieved from the data source along with a common set of rules configured to format the retrieved data in a manner in accordance with one or more predefined data quality rules of the common set of rules. At least one predefined data quality rule is adjusted utilizing at least one editable widget to form a modified set of data quality rules adapted for use with a specified application. The modified set of data quality rules is applied to the retrieved data.
    Type: Application
    Filed: July 18, 2012
    Publication date: January 3, 2013
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Mohan N. Dani, Anuj Gupta, Mukesh K. Mohania, Girish Venkatachaliah
  • Publication number: 20130007629
    Abstract: During application of data quality rules to a data set obtained from a data source, data is retrieved from the data source along with a common set of rules configured to format the retrieved data in a manner in accordance with one or more predefined data quality rules of the common set of rules. At least one predefined data quality rule is adjusted utilizing at least one editable widget to form a modified set of data quality rules adapted for use with a specified application. The modified set of data quality rules is applied to the retrieved data.
    Type: Application
    Filed: June 30, 2011
    Publication date: January 3, 2013
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Mohan N. Dani, Anuj Gupta, Mukesh K. Mohania, Girish Venkatachaliah
  • Publication number: 20110179325
    Abstract: A system for testing input/output pads of an integrated circuit includes boundary scan register chains, a test control unit and a test data processing unit. Input test data is provided to the test control unit, which then provides the test data to the test data processing unit. The test data processing unit processes the test data to obtain processed test data. Thereafter, the processed data is loaded in each of the boundary scan register chains in parallel. The processed test data is propagated sequentially through the plurality of boundary scan register chains to obtain output test data. The output test data is used to detect faults present in the input/output pads of the integrated circuit.
    Type: Application
    Filed: January 15, 2010
    Publication date: July 21, 2011
    Applicant: FREESCALE SEMICONDUCTOR, INC
    Inventors: Anuj Gupta, Himanshu Kukreja
  • Publication number: 20110145933
    Abstract: Embodiments of the invention broadly contemplate a situational application development framework that provides consumable software components that are accessed as services and monitored in a standardized fashion through a mediator service and thus suitable for use in a controlled development environment. At least one embodiment of the invention thus facilitates on the fly application creation using mashup makers in an enterprise setup.
    Type: Application
    Filed: December 16, 2009
    Publication date: June 16, 2011
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Kapil Gambhir, Anuj Gupta, Jaspreet Singh
  • Patent number: 7227798
    Abstract: An improved latch-type sense amplifier circuit having two cross-coupled inverters forming a latch, a supply coupling device for selectively connecting the latch to a supply source, and a bit line coupling circuits for selectively connecting the inputs of each inverter to the complimentary bit line from the memory array. The circuit is configured to sense a voltage difference between the bit lines with improved reliability by providing a delayed sense amplifier enable signal to pass transistors for delaying disconnection of the bit lines from the sense amplifier until the latching action is completed, and adding two transistors in series with the existing transistors of the conventional latch for correcting the offset between the threshold voltages of the inverters of the latch.
    Type: Grant
    Filed: October 6, 2003
    Date of Patent: June 5, 2007
    Assignee: STMicroelectronics Pvt. Ltd.
    Inventors: Anuj Gupta, Sanjeev Chopra
  • Publication number: 20040136253
    Abstract: An improved latch-type sense amplifier circuit having two cross-coupled inverters forming a latch, a supply coupling device for selectively connecting the latch to a supply source, and a bit line coupling circuits for selectively connecting the inputs of each inverter to the complimentary bit line from the memory array. The circuit is configured to sense a voltage difference between the bit lines with improved reliability by providing a delayed sense amplifier enable signal to pass transistors for delaying disconnection of the bit lines from the sense amplifier until the latching action is completed, and adding two transistors in series with the existing transistors of the conventional latch for correcting the offset between the threshold voltages of the inverters of the latch.
    Type: Application
    Filed: October 6, 2003
    Publication date: July 15, 2004
    Applicant: STMicroelectronics Pvt. Ltd.
    Inventors: Anuj Gupta, Sanjeev Chopra