Patents by Inventor Anuj K. Adhikaram

Anuj K. Adhikaram has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11644444
    Abstract: A method for quantitatively evaluating the expected ultrasonic inspectability of a designed part using ray tracing. First, a model of a part imported. Materials having different indices of refraction are selected for the part and an acoustic coupling medium. Then the following structures and positional relationships are defined: an ultrasonic transducer array comprising a plurality of elements, a position of the acoustic coupling medium between the transducer array and the part, and a plurality of positions of a transmit aperture relative to the part. For each defined position of the transmit aperture, a path of a respective ray is traced from a center of the transmit aperture through the part and then to a respective receive location on the transducer array. Also, a respective value of an inspectability margin is calculated based at least in part on a respective distance between a center of the receive aperture and the respective receive location.
    Type: Grant
    Filed: October 19, 2021
    Date of Patent: May 9, 2023
    Assignee: The Boeing Company
    Inventors: Hong Hue Tat, Yuan-Jye Jason Wu, Anuj K. Adhikaram, Christopher R. Loesche
  • Publication number: 20220268738
    Abstract: A method for quantitatively evaluating the expected ultrasonic inspectability of a designed part using ray tracing. First, a model of a part imported. Materials having different indices of refraction are selected for the part and an acoustic coupling medium. Then the following structures and positional relationships are defined: an ultrasonic transducer array comprising a plurality of elements, a position of the acoustic coupling medium between the transducer array and the part, and a plurality of positions of a transmit aperture relative to the part. For each defined position of the transmit aperture, a path of a respective ray is traced from a center of the transmit aperture through the part and then to a respective receive location on the transducer array. Also, a respective value of an inspectability margin is calculated based at least in part on a respective distance between a center of the receive aperture and the respective receive location.
    Type: Application
    Filed: October 19, 2021
    Publication date: August 25, 2022
    Applicant: The Boeing Company
    Inventors: Hong Hue Tat, Yuan-Jye Jason Wu, Anuj K. Adhikaram, Christopher R. Loesche