Patents by Inventor Anuja Sehgal
Anuja Sehgal has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7952370Abstract: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.Type: GrantFiled: January 8, 2010Date of Patent: May 31, 2011Assignee: International Business Machines CorporationInventors: Frank D. Ferraiolo, Anuja Sehgal, Peilin Song, Michael A. Sperling
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Publication number: 20100109700Abstract: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.Type: ApplicationFiled: January 8, 2010Publication date: May 6, 2010Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Frank D. Ferraiolo, Anuja Sehgal, Peilin Song, Michael A. Sperling
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Patent number: 7646208Abstract: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.Type: GrantFiled: January 14, 2008Date of Patent: January 12, 2010Assignee: International Business Machines CorporationInventors: Frank D. Ferraiolo, Anuja Sehgal, Peilin Song, Michael A. Sperling
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Patent number: 7443187Abstract: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an input voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.Type: GrantFiled: October 18, 2007Date of Patent: October 28, 2008Assignee: International Business Machines CorporationInventors: Keith A. Jenkins, Anuja Sehgal, Peilin Song
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Publication number: 20080258751Abstract: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an input voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.Type: ApplicationFiled: July 2, 2008Publication date: October 23, 2008Applicant: International Business Machines CorporationInventors: Keith A. Jenkins, Anuja Sehgal, Peilin Song
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Publication number: 20080129325Abstract: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.Type: ApplicationFiled: January 14, 2008Publication date: June 5, 2008Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATIONInventors: Frank D. Ferraiolo, Anuja Sehgal, Peilin Song, Michael A. Sperling
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Patent number: 7355435Abstract: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.Type: GrantFiled: February 10, 2005Date of Patent: April 8, 2008Assignee: International Business Machines CorporationInventors: Frank D. Ferraiolo, Anuja Sehgal, Peilin Song, Michael A. Sperling
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Patent number: 7355429Abstract: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an output voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.Type: GrantFiled: March 24, 2005Date of Patent: April 8, 2008Assignee: International Business Machines CorporationInventors: Keith A. Jenkins, Anuja Sehgal, Peilin Song
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Publication number: 20080036477Abstract: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit includes the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning includes shifting respective levels of the voltages such that the voltages are within an input voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison includes detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.Type: ApplicationFiled: October 18, 2007Publication date: February 14, 2008Applicant: International Business Machines CorporationInventors: Keith Jenkins, Anuja Sehgal, Peilin Song
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Publication number: 20080007272Abstract: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative difference in phase of the two delay chains. The two delay chains are programmable to detect various frequencies.Type: ApplicationFiled: February 10, 2005Publication date: January 10, 2008Applicant: International Business Machines CorporationInventors: Frank Ferraiolo, Anuja Sehgal, Peilin Song, Michael Sperling
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Publication number: 20060214672Abstract: Techniques for on-chip detection of integrated circuit power supply noise are disclosed. By way of example, a technique for monitoring a power supply line in an integrated circuit comprises the following steps/operations. A first signal and a second signal are preconditioned. The first signal is representative of a voltage of the power supply line being monitored. The second signal is representative of a voltage of a reference power supply line. Preconditioning comprises shifting respective levels of the voltages such that the voltages are within an input voltage range of comparator circuitry. Then, the preconditioned first signal and the preconditioned second signal are compared in accordance with the comparator circuitry. Comparison comprises detecting when a difference exists between the voltage level of the preconditioned first signal and the voltage level of the preconditioned second signal.Type: ApplicationFiled: March 24, 2005Publication date: September 28, 2006Applicant: International Business Machines CorporationInventors: Keith Jenkins, Anuja Sehgal, Peilin Song