Patents by Inventor Anuradha Sundararajan

Anuradha Sundararajan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for analog graphics sample clock frequency offset detection and verification
    Patent number: 7825990
    Abstract: A method and apparatus for an analog-to-digital video signal converter. The converter is controlled by a clock with controllable frequency and phase for sampling an analog signal. A circuit corrects the clock frequency using a period of a columnar frame differences as a function of columnar location. The sampling clock frequency is changed by an amount dependent on the period of the columnar differences. A second measure of the difference between successive frames is computed for a sequence of clock phases. The frequency of the clock is verified using a characteristic of the second measure. The characteristic can be the ratio of the maximum to the minimum of the second measure over selected clock phases. Other characteristics can be used such as a difference of a maximum and a minimum measure.
    Type: Grant
    Filed: February 16, 2006
    Date of Patent: November 2, 2010
    Assignee: Texas Instruments Incorporated
    Inventors: Bing Ouyang, John Michael Hayden, Troy Lane Ethridge, Anuradha Sundararajan, Larry D. Dickinson
  • Method and apparatus for analog graphics sample clock frequency verification
    Patent number: 7733424
    Abstract: A method and apparatus for an analog-to-digital video signal converter. The converter is controlled by a clock with controllable frequency and phase for sampling an analog signal. A measure of the difference between successive frames of the image is computed for a sequence of clock phases. The measure can be a count taken over pixels of the magnitude of the difference between a pixel in one frame and the corresponding pixel in a following frame exceeding a threshold value. The frequency of the clock is verified using a characteristic of the frame difference. The characteristic can be the ratio of the maximum measure to the minimum measure over the selected clock phases. Other characteristics can be used such as a difference of a maximum and a minimum measure.
    Type: Grant
    Filed: February 16, 2006
    Date of Patent: June 8, 2010
    Assignee: Texas Instruments Incorporated
    Inventors: John Michael Hayden, Bing Ouyang, Troy Lane Ethridge, Anuradha Sundararajan, Larry D. Dickinson
  • Method and apparatus for analog graphics sample clock frequency verification
    Publication number: 20060274207
    Abstract: A method and apparatus for an analog-to-digital video signal converter. The converter is controlled by a clock with controllable frequency and phase for sampling an analog signal. A measure of the difference between successive frames of the image is computed for a sequence of clock phases. The measure can be a count taken over pixels of the magnitude of the difference between a pixel in one frame and the corresponding pixel in a following frame exceeding a threshold value. The frequency of the clock is verified using a characteristic of the frame difference. The characteristic can be the ratio of the maximum measure to the minimum measure over the selected clock phases. Other characteristics can be used such as a difference of a maximum and a minimum measure.
    Type: Application
    Filed: February 16, 2006
    Publication date: December 7, 2006
    Inventors: John Hayden, Bing Ouyang, Troy Ethridge, Anuradha Sundararajan, Larry Dickinson
  • Method and apparatus for analog graphics sample clock frequency offset detection and verification
    Publication number: 20060274194
    Abstract: A method and apparatus for an analog-to-digital video signal converter. The converter is controlled by a clock with controllable frequency and phase for sampling an analog signal. A circuit corrects the clock frequency using a period of a columnar frame differences as a function of columnar location. The sampling clock frequency is changed by an amount dependent on the period of the columnar differences. A second measure of the difference between successive frames is computed for a sequence of clock phases. The frequency of the clock is verified using a characteristic of the second measure. The characteristic can be the ratio of the maximum to the minimum of the second measure over selected clock phases. Other characteristics can be used such as a difference of a maximum and a minimum measure.
    Type: Application
    Filed: February 16, 2006
    Publication date: December 7, 2006
    Inventors: Bing Ouyang, John Hayden, Troy Ethridge, Anuradha Sundararajan, Larry Dickinson