Abstract: Automated mocking of computer system deployments is facilitated. A method as described herein can include associating, by a first system operatively coupled to a processor, respective properties of a first deployment of a second system on a first computing device with respective automation mapping functions; executing, by the first system, the automation mapping functions in an order defined by dependencies between respective ones of the automation mapping functions, resulting in a series of system modeling tasks and an order associated with the series of system modeling tasks; and performing, by the first system, the series of system modeling tasks in the order associated therewith, resulting in a second deployment of the second system being created on a second computing device that is distinct from the first computing device.

Abstract: Automated mocking of computer system deployments is facilitated. A method as described herein can include associating, by a first system operatively coupled to a processor, respective properties of a first deployment of a second system on a first computing device with respective automation mapping functions; executing, by the first system, the automation mapping functions in an order defined by dependencies between respective ones of the automation mapping functions, resulting in a series of system modeling tasks and an order associated with the series of system modeling tasks; and performing, by the first system, the series of system modeling tasks in the order associated therewith, resulting in a second deployment of the second system being created on a second computing device that is distinct from the first computing device.

Abstract: Systems and methods facilitating automated mocking of computer system deployments are described herein. A method as described herein can include associating, by a first system operatively coupled to a processor, respective properties of a first deployment of a second system on a first computing device with respective automation mapping functions; executing, by the first system, the automation mapping functions in an order defined by dependencies between respective ones of the automation mapping functions, resulting in a series of system modeling tasks and an order associated with the series of system modeling tasks; and performing, by the first system, the series of system modeling tasks in the order associated therewith, resulting in a second deployment of the second system being created on a second computing device that is distinct from the first computing device.

Abstract: Systems and methods facilitating automated mocking of computer system deployments are described herein. A method as described herein can include associating, by a first system operatively coupled to a processor, respective properties of a first deployment of a second system on a first computing device with respective automation mapping functions; executing, by the first system, the automation mapping functions in an order defined by dependencies between respective ones of the automation mapping functions, resulting in a series of system modeling tasks and an order associated with the series of system modeling tasks; and performing, by the first system, the series of system modeling tasks in the order associated therewith, resulting in a second deployment of the second system being created on a second computing device that is distinct from the first computing device.

Abstract: A control system for poly-phase power inverters that uses feedback sensed voltages and currents to control the switching of solid state power switches in the inverter bridges, producing a nearly ideal sinewave voltage output regardless of load induced or switching harmonic voltages. The system operates in combination with the inverter power switches and switch drivers, particularly incorporating a digital programed optimal controller with virtually no delay in implementing the feedback control, and automatically correcting for any sensed line voltage distortions. The system inherently provides a high recovery speed for voltage transients.