Patents by Inventor An-Yi Chen

An-Yi Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9565238
    Abstract: A method for controlling an electronic apparatus, a handheld electronic apparatus, and a monitoring system are provided. An image within an image capturing range is displayed on a display unit by an image capturing unit. A digital stamp in the image is detected. The digital stamp corresponds to a single or multiple controllable devices. A control interface corresponding to the digital stamp is displayed on the image. An operation action a user executes on the control interface is detected so as to control the controllable device corresponding to the digital stamp.
    Type: Grant
    Filed: May 16, 2014
    Date of Patent: February 7, 2017
    Assignee: Tatung Company
    Inventors: An-Yi Chen, Chia-Wei Kang, Tsung-Sheng Kuo
  • Publication number: 20150100803
    Abstract: A method for controlling an electronic apparatus, a handheld electronic apparatus, and a monitoring system are provided. An image within an image capturing range is displayed on a display unit by an image capturing unit. A digital stamp in the image is detected. The digital stamp corresponds to a single or multiple controllable devices. A control interface corresponding to the digital stamp is displayed on the image. An operation action a user executes on the control interface is detected so as to control the controllable device corresponding to the digital stamp.
    Type: Application
    Filed: May 16, 2014
    Publication date: April 9, 2015
    Applicant: Tatung Company
    Inventors: An-Yi Chen, Chia-Wei Kang, Tsung-Sheng Kuo
  • Publication number: 20060101331
    Abstract: A method for automated test-case generation. A first type SDL is translated to a second type SDL in accordance with translation rules. The second type SDL is analyzed using a coverage analysis algorithm for calculating the coverage of the second type SDL, and test cases corresponding to the second type SDL are generated according to the coverage. Test cases complying with tree and tabular combined notation (TTCN) formats are generated according to a tree structure corresponding to the second type SDL and TTCNs.
    Type: Application
    Filed: January 13, 2005
    Publication date: May 11, 2006
    Inventors: Farn Wang, Jian-Ming Wang, An-Yi Chen, Chiu-Han Hsiao