Abstract: A component inspection device including: a storage section configured to store at least a non-defective product images; a generation section configured to generate a defective product image using a machine learning model; a setting section configured for a user to set a parameter for component inspection; and an output section configured to perform inspection, by using the parameter, on the non-defective product image stored in the storage section and the defective product image generated by the generation section, the output section being configured to output an inspection result.