Abstract: In at least one embodiment, a magnetic recording head comprising first and second linear levels of magnetic recording devices is provided. Each device in the first linear level is aligned adjacently in a row and is spaced apart from another device in the first linear level. The first linear level is perpendicular to a comparative direction of a recording media travel. The second linear level of magnetic recording devices being connected to the first linear level of magnetic recording devices. Each device in the second linear level is aligned adjacently in a row and is spaced apart from another device in the second linear level. Each device in the second linear level is aligned with an insulating gap between the each device in the first linear level.

Abstract: The present invention provides a source of Group V and VI atoms, and in particular arsenic atoms, usable in MBE as a growth source or a doping source. The arsenic atoms are produced in two steps. In the first step, a sublimator vaporizes solid arsenic, producing a molecular beam of arsenic tetramers and/or dimers. The molecular beam source can optionally include a cracker to produce As.sub.2 from As.sub.4. In the second step, the molecular beam impinges on a surface of a heated element, termed an atomizer, producing an output beam containing atomic arsenic. The atomizer is at a temperature above about 1200K and a pressure below about 10.sup.-3 torr or at a temperature above about 1400K and a pressure below about 10.sup.-2 torr. For other Group V and VI elements, different atomizer temperatures and pressures are used.

Abstract: The present invention provides a photoionization mass spectroscopy flux monitor for gaseous species above a sample surface. It provides an in situ, real time, species specific, nonintrusive probe with a geometry compatible with conventional MBE growth chambers. Gaseous species are photoionized above a sample surface and the ionized gaseous species are extracted parallel to the sample surface and coupled into a mass spectrometer inlet adjacent to the sample surface. The geometry of the flux monitor allows for simultaneous coupling of a charged particle beam with the sample surface, for example for monitoring film growth with RHEED.