Patents by Inventor Archer Lawrence

Archer Lawrence has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for test data capture and compression for electronic device analysis
    Patent number: 7149640
    Abstract: Electronic devices, such as memory devices are tested by applying test data, such as vectors of memory data having data field, control and address information, with a tester to detect error responses. Applied test data is captured, compressed and stored for subsequent analysis to isolate the test data associated with the error response. The saved compressed test data is de-compressed to replay the test data for a logic analyzer so that adequate history of the test data exists to determine the test cycles that included the stimulus associated with the error response. Identification of the test cycles that include the stimulus associated with the error response allows creation of test programs that run in reduced time by avoiding empty test cycles not associated with the error response.
    Type: Grant
    Filed: June 20, 2003
    Date of Patent: December 12, 2006
    Assignee: King Tiger Technology, Inc.
    Inventors: Archer Lawrence, Jack Little, Brian Kleen, Robert Barr
  • Method and system for test data capture and compression for electronic device analysis
    Publication number: 20050021275
    Abstract: Electronic devices, such as memory devices are tested by applying test data, such as vectors of memory data having data field, control and address information, with a tester to detect error responses. Applied test data is captured, compressed and stored for subsequent analysis to isolate the test data associated with the error response. The saved compressed test data is de-compressed to replay the test data for a logic analyzer so that adequate history of the test data exists to determine the test cycles that included the stimulus associated with the error response. Identification of the test cycles that include the stimulus associated with the error response allows creation of test programs that run in reduced time by avoiding empty test cycles not associated with the error response.
    Type: Application
    Filed: June 20, 2003
    Publication date: January 27, 2005
    Inventors: Archer Lawrence, Jack Little, Brian Kleen, Robert Barr