Patents by Inventor Arion Sprague

Arion Sprague has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SYSTEMS AND METHODS FOR DETERMINING RELATIONSHIPS BETWEEN DEFECTS
    Publication number: 20230333547
    Abstract: Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
    Type: Application
    Filed: June 19, 2023
    Publication date: October 19, 2023
    Inventors: Andrew POH, Andre Frederico Cavalheiro MENCK, Arion SPRAGUE, Benjamin GRABHAM, Benjamin LEE, Bianca RAHILL-MARIER, Gregoire OMONT, Jim INOUE, Jonah SCHEINERMAN, Maciej ALBIN, Myles SCOLNICK, Paul GRIBELYUK, Steven FACKLER, Tam-Sanh NGUYEN, Thomas POWELL, William SEATON
  • Systems and methods for determining relationships between defects
    Patent number: 11681282
    Abstract: Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
    Type: Grant
    Filed: April 10, 2020
    Date of Patent: June 20, 2023
    Assignee: Palantir Technologies Inc.
    Inventors: Andrew Poh, Andre Frederico Cavalheiro Menck, Arion Sprague, Benjamin Grabham, Benjamin Lee, Bianca Rahill-Marier, Gregoire Omont, Jim Inoue, Jonah Scheinerman, Maciej Albin, Myles Scolnick, Paul Gribelyuk, Steven Fackler, Tam-Sanh Nguyen, Thomas Powell, William Seaton
  • User interface for managing defects
    Patent number: 10839504
    Abstract: User interfaces for managing defects are provided. A defect selection interface may include a set of defect items for selection by a user. The defect selection interface may include one or more first visuals indicating similarity of the set of defect items to other defect items. An issue selection interface may include a set of issue items for selection by the user. Individual issue items may include one or more defect items added to the individual issue items. A defect comparison interface may include a comparison of a defect item to an issue item. The defect comparison interface may include one or more second visuals indicating similarity of the defect item to the issue item. Based on the user's selection, the defect item may be added to the issue item.
    Type: Grant
    Filed: March 8, 2019
    Date of Patent: November 17, 2020
    Assignee: Palantir Technologies Inc.
    Inventors: Alexander Taheri, Alexandru-viorel Antihi, Arion Sprague, Benjamin Grabham, Benjamin Lee, Gregoire Omont, Jim Inoue, Michael Yang, Myles Scolnick, Pierre Lucotte, Ryan Rowe, Tarik Benabdallah, Thomas Powell
  • SYSTEMS AND METHODS FOR DETERMINING RELATIONSHIPS BETWEEN DEFECTS
    Publication number: 20200241518
    Abstract: Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
    Type: Application
    Filed: April 10, 2020
    Publication date: July 30, 2020
    Inventors: Andrew Poh, Andre Frederico Cavalheiro Menck, Arion Sprague, Benjamin Grabham, Benjamin Lee, Bianca Rahill-Marier, Gregoire Omont, Jim Inoue, Jonah Scheinerman, Maciej Albin, Myles Scolnick, Paul Gribelyuk, Steven Fackler, Tam-Sanh Nguyen, Thomas Powell, William Seaton
  • Systems and methods for determining relationships between defects
    Patent number: 10620618
    Abstract: Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
    Type: Grant
    Filed: December 20, 2016
    Date of Patent: April 14, 2020
    Assignee: Palantir Technologies Inc.
    Inventors: Andrew Poh, Andre Frederico Cavalheiro Menck, Arion Sprague, Benjamin Grabham, Benjamin Lee, Bianca Rahill-Marier, Gregoire Omont, Jim Inoue, Jonah Scheinerman, Maciej Albin, Myles Scolnick, Paul Gribelyuk, Steven Fackler, Tam-Sanh Nguyen, Thomas Powell, William Seaton
  • USER INTERFACE FOR MANAGING DEFECTS
    Publication number: 20190206049
    Abstract: User interfaces for managing defects are provided. A defect selection interface may include a set of defect items for selection by a user. The defect selection interface may include one or more first visuals indicating similarity of the set of defect items to other defect items. An issue selection interface may include a set of issue items for selection by the user. Individual issue items may include one or more defect items added to the individual issue items. A defect comparison interface may include a comparison of a defect item to an issue item. The defect comparison interface may include one or more second visuals indicating similarity of the defect item to the issue item.
    Type: Application
    Filed: March 8, 2019
    Publication date: July 4, 2019
    Inventors: Alexander Taheri, Alexandru-viorel Antihi, Arion Sprague, Benjamin Grabham, Benjamin Lee, Gregoire Omont, Jim Inoue, Michael Yang, Myles Scolnick, Pierre Lucotte, Ryan Rowe, Tarik Benabdallah, Thomas Powell
  • User interface for managing defects
    Patent number: 10249033
    Abstract: User interfaces for managing defects are provided. A defect selection interface may include a set of defect items for selection by a user. The defect selection interface may include one or more first visuals indicating similarity of the set of defect items to other defect items. An issue selection interface may include a set of issue items for selection by the user. Individual issue items may include one or more defect items added to the individual issue items. A defect comparison interface may include a comparison of a defect item to an issue item. The defect comparison interface may include one or more second visuals indicating similarity of the defect item to the issue item. Based on the user's selection, the defect item may be added to the issue item.
    Type: Grant
    Filed: March 2, 2017
    Date of Patent: April 2, 2019
    Assignee: Palantir Technologies Inc.
    Inventors: Alexander Taheri, Alexandru Antihi, Arion Sprague, Benjamin Grabham, Benjamin Lee, Gregoire Omont, Jim Inoue, Michael Yang, Myles Scolnick, Pierre Lucotte, Ryan Rowe, Tarik Benabdallah, Thomas Powell
  • SYSTEMS AND METHODS FOR DETERMINING RELATIONSHIPS BETWEEN DEFECTS
    Publication number: 20180173212
    Abstract: Systems and methods are provided for identifying relationships between defects. The system may obtain defect items and associated information. Defect items may be compared to one another based on their attributes to determine how related they are. According to the comparisons, defect items may be grouped together into issue items for further analysis by a user. The system may further update a defect comparison model according to user interaction with defect items.
    Type: Application
    Filed: December 20, 2016
    Publication date: June 21, 2018
    Inventors: Andrew Poh, Andre Frederico Cavalheiro Menck, Arion Sprague, Benjamin Grabham, Benjamin Lee, Bianca Rahill-Marier, Gregoire Omont, Jim Inoue, Jonah Scheinerman, Maciej Albin, Myles Scolnick, Paul Gribelyuk, Steven Fackler, Tam-Sanh Nguyen, Thomas Powell, William Seaton