Abstract: An electronic device handling apparatus, which handles an electronic device under test having a first main surface provided thereon with first device terminals and a second main surface provided thereon with second device terminals, includes: a contact arm having a holding-side contact arm to which a first socket is attached and a suction pad which holds the electronic device under test; an alignment apparatus which positions the first socket and the electronic device under test; and the alignment apparatus which positions, with respect to a second socket, the electronic device under test being held by the suction pad and contacting the first socket, wherein the contact arm presses the second device terminals of the electronic device under test to the second socket.

Abstract: An electronic device handling apparatus, wherein an image of terminals of an electronic device to be tested having the terminals at its end edge portions held by a conveyor device is taken, edges of terminals arranged in the X-axis direction are extracted from data of an taken image and binarization processing is performed on the data, while edges of terminals arranged in the Y-axis direction are extracted from data of the taken image and binarization processing is performed on the data, so that positions of edges of respective terminals are located from the obtained two binary images. Then, a positional deviation amount of the electronic device is calculated by comparing with reference positional information of edges of terminals of a reference electronic device and, based thereon, a posture of the electronic device to be tested is corrected.

Abstract: In an electronic device test apparatus using image processing technology to position an IC device relative to a socket, a calibration method of an electronic device test apparatus of calibrating a relative position of a device camera with respect to a socket, the method comprising: calculating an offset amount of a socket guide with respect to the socket on the basis of a relative position of the socket camera with respect to the socket guide and a relative position of a socket camera with respect to the socket; and adding this offset amount to the relative position of the device camera with respect to the socket guide so as to calculate the relative position of the device camera with respect to the socket.

Abstract: A position detecting apparatus for detecting a position of an electronic component, which includes a terminal, includes an image acquiring unit for acquiring an image of the terminal, a terminal area detecting unit for detecting an area of the terminal from the image acquired by the image acquiring unit and an electronic component position detecting unit for detecting a position of the electronic component based on the area of the terminal detected by the terminal area detecting unit and predetermined terminal information of the electronic component.

Abstract: A position detecting apparatus for detecting a position of an electronic component, which includes a terminal, includes an image acquiring unit for acquiring an image of the terminal, a terminal area detecting unit for detecting an area of the terminal from the image acquired by the image acquiring unit and an electronic component position detecting unit for detecting a position of the electronic component based on the area of the terminal detected by the terminal area detecting unit and predetermined terminal information of the electronic component.