Patents by Inventor Armand JONKERS

Armand JONKERS has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Analysis of layered samples with XRF
    Patent number: 10705035
    Abstract: A method of making X-ray fluorescence, XRF, measurements of a layered sample is described. At least two measurements are made, one through one surface of the sample and another through the opposite surface. This may be conveniently done by inverting the sample between the measurements. The data from the additional measurements may be used to calculate multiple parameters of the sample, such as the concentration, density or thickness of each of the layers.
    Type: Grant
    Filed: December 20, 2017
    Date of Patent: July 7, 2020
    Assignee: MALVERN PANALYTICAL B.V.
    Inventors: Armand Jonkers, Justyna Wiedemair
  • Analysis of Layered Samples with XRF
    Publication number: 20180180562
    Abstract: A method of making X-ray fluorescence, XRF, measurements of a layered sample is described. At least two measurements are made, one through one surface of the sample and another through the opposite surface. This may be conveniently done by inverting the sample between the measurements. The data from the additional measurements may be used to calculate multiple parameters of the sample, such as the concentration, density or thickness of each of the layers.
    Type: Application
    Filed: December 20, 2017
    Publication date: June 28, 2018
    Inventors: Armand JONKERS, Justyna WIEDEMAIR