Patents by Inventor Armin Horn
Armin Horn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 11558146Abstract: A signal analysis apparatus for analyzing an input signal is described. The input signal includes a symbol sequence. The symbol sequence includes data information and redundant data information. The signal analysis apparatus includes one or more circuits composed of a decoder module, an error correction module, and a processing module. The decoder module is configured to decode the input signal, thereby obtaining a decoded input signal. The error correction module is configured to identify at least one error in the decoded input signal. The processing module is configured to generate a data set. The data set includes information on the at least one identified error. The data set further includes information on at least one of a portion of the input signal being associated with the error and a portion of the decoded input signal being associated with the error. Further, a signal analysis device and a signal analysis method are described.Type: GrantFiled: October 20, 2020Date of Patent: January 17, 2023Assignee: Rohde & Schwarz GmbH & Co. KGInventor: Armin Horn
-
Publication number: 20220123859Abstract: A signal analysis apparatus for analyzing an input signal is described. The input signal includes a symbol sequence. The symbol sequence includes data information and redundant data information. The signal analysis apparatus includes one or more circuits composed of a decoder module, an error correction module, and a processing module. The decoder module is configured to decode the input signal, thereby obtaining a decoded input signal. The error correction module is configured to identify at least one error in the decoded input signal. The processing module is configured to generate a data set. The data set includes information on the at least one identified error. The data set further includes information on at least one of a portion of the input signal being associated with the error and a portion of the decoded input signal being associated with the error. Further, a signal analysis device and a signal analysis method are described.Type: ApplicationFiled: October 20, 2020Publication date: April 21, 2022Applicant: Rohde & Schwarz GmbH & Co. KGInventor: Armin Horn
-
Publication number: 20210018536Abstract: A measurement device is provided. The measurement device comprises an input, and a trigger unit. In this context, the input is configured to receive an input signal. In addition to this, the trigger unit is configured to trigger according to a first trigger condition with respect to said input signal or according to at least one second trigger condition with respect to said input signal.Type: ApplicationFiled: July 19, 2019Publication date: January 21, 2021Inventor: Armin HORN
-
Patent number: 10014978Abstract: An apparatus and method for processing a data signal transferred using a specific data protocol, DP, said apparatus comprising a decoding unit configured to decode stepwise the data signal according to the used data protocol, wherein said decoding unit is adapted to decode in a decoding step rising and falling signal edges as an intermediate decoding result; and a decoding result labelling unit configured to provide intermediate decoding result labels, L, for the data signal, DS, after each decoding step performed by said decoding unit and configured to map the provided decoding result labels, L, to the data signal, DS.Type: GrantFiled: August 31, 2015Date of Patent: July 3, 2018Assignee: ROHDE & SCHWARZ GMBH & CO. KGInventors: Armin Horn, John Galbraith, Joe Zhang, Robin Hoeye
-
Patent number: 9998278Abstract: An apparatus and method for synchronization of a decoding unit to a received data bit stream, DBS, encoded according to a data protocol, DP, said apparatus comprising a sampling unit adapted to sample a bit sequence, BSEQ, having a predetermined bit sequence length, BSEQL, from the received data bit stream, DBS, and a checking unit configured to check whether at least one specific bit of the sampled bit sequence, BSEQ, fulfills a predetermined error detection condition, EDC, defined by said data protocol, DP, and further configured to synchronize the decoding unit to the received data bit stream, DBS, if the checking result is positive.Type: GrantFiled: September 7, 2015Date of Patent: June 12, 2018Assignee: ROHDE & SCHWARZ GMBH & CO. KGInventors: Joe Zhang, Armin Horn
-
Publication number: 20170068590Abstract: An apparatus and method for synchronization of a decoding unit to a received data bit stream, DBS, encoded according to a data protocol, DP, said apparatus comprising a sampling unit adapted to sample a bit sequence, BSEQ, having a prede-termined bit sequence length, BSEQL, from the received data bit stream, DBS, and a checking unit configured to check whether at least one specific bit of the sampled bit sequence, BSEQ, fulfills a predetermined error detection condition, EDC, defined by said data protocol, DP, and further configured to synchronize the decoding unit to the received data bit stream, DBS, if the checking result is positive.Type: ApplicationFiled: September 7, 2015Publication date: March 9, 2017Inventors: Joe Zhang, Armin Horn
-
Publication number: 20170063492Abstract: An apparatus and method for processing a data signal transferred using a specific data protocol, DP, said apparatus comprising a decoding unit configured to decode stepwise the data signal according to the used data protocol, wherein said decoding unit is adapted to decode in a decoding step rising and falling signal edges as an intermediate decoding result; and a decoding result labelling unit configured to provide intermediate decoding result labels, L, for the data signal, DS, after each decoding step performed by said decoding unit and configured to map the provided decoding result labels, L, to the data signal, DS.Type: ApplicationFiled: August 31, 2015Publication date: March 2, 2017Inventors: Armin Horn, John Galbraith, Joe Zhang, Robin Hoeye
-
Patent number: 8591105Abstract: The invention relates to an optical element for guiding and forming a laser beam, and to a method for recording beam parameters, particularly in a laser system, comprising a carrier substrate (40) and a coating (39), which is applied to at least one side of the carrier substrate (40), and comprising at least one temperature sensor (38). The temperature sensor (38) is comprised of a number of pixels arranged in a matrix, and each respective pixel has at least one temperature-sensitive element (39). The at least one temperature-sensitive element (39) of the pixel is constructed inside the carrier substrate (40) made of silicon.Type: GrantFiled: April 3, 2006Date of Patent: November 26, 2013Assignee: TRUMPF Werkzeugmaschinen GmbH + Co. KGInventors: Jürgen-Michael Weick, Armin Horn, Gerhard Hammann, Peter Laitenberger, Nick Collier, Ross Peter Jones
-
Patent number: 8084708Abstract: Systems and related methods of programming a laser processing device for automated processing of a workpiece including indicating a processing location on a workpiece with a processing location indicator. The processing location is detected with a processing location detector. The scanner optics of the laser processing device are adjusted to a set position corresponding to the detected processing location. A set position of the scanner optics is detected with a processing location evaluator, and a control program corresponding to the detected set position of the scanner optics is generated with the processing location evaluator.Type: GrantFiled: February 24, 2006Date of Patent: December 27, 2011Assignee: Trumpf Laser-und Systemtechnik GmbHInventors: Wolfgang Andreasch, Armin Horn, Peter Kaupp
-
Publication number: 20100296546Abstract: The invention relates to an optical element for guiding and forming a laser beam, and to a method for recording beam parameters, particularly in a laser system, comprising a carrier substrate (40) and a coating (39), which is applied to at least one side of the carrier substrate (40), and comprising at least one temperature sensor (38). The temperature sensor (38) is comprised of a number of pixels arranged in a matrix, and each respective pixel has at least one temperature-sensitive element (39). The at least one temperature-sensitive element (39) of the pixel is constructed inside the carrier substrate (40) made of silicon.Type: ApplicationFiled: April 3, 2006Publication date: November 25, 2010Applicant: TRUMPF WERKZEUGMASCHINEN GMBH + CO. KGInventors: Jürgen-Michael Weick, Armin Horn, Gerhard Hammann, Peter Laitenberger, Nick Collier, Ross Peter Jones
-
Patent number: 7528344Abstract: Determination of the relative positioning of a laser machining beam and a process gas jet on a laser machine tool are accomplished by motion of detections made while moving the machining beam and gas jet in relation to a detection element. In some cases actions of the beam and gas jet themselves are detected, such as by cutting light response and sensor deflection caused by the gas jet. Relative head positions at the time of the deflections are used to calculate misalignment between the laser beam and gas jet.Type: GrantFiled: March 5, 2007Date of Patent: May 5, 2009Assignee: TRUMPF Werkzeugmaschinen GmbH + Co. KGInventors: Armin Horn, Gerhard Hammann
-
Publication number: 20070228025Abstract: Determination of the relative positioning of a laser machining beam and a process gas jet on a laser machine tool are accomplished by motion of detections made while moving the machining beam and gas jet in relation to a detection element. In some cases actions of the beam and gas jet themselves are detected, such as by cutting light response and sensor deflection caused by the gas jet. Relative head positions at the time of the deflections are used to calculate misalignment between the laser beam and gas jet.Type: ApplicationFiled: March 5, 2007Publication date: October 4, 2007Applicant: TRUMPF WERKZEUGMASCHINEN GMBH + CO. KGInventors: Armin Horn, Gerhard Hammann
-
Publication number: 20060180582Abstract: Systems and related methods of programming a laser processing device for automated processing of a workpiece including indicating a processing location on a workpiece with a processing location indicator. The processing location is detected with a processing location detector. The scanner optics of the laser processing device are adjusted to a set position corresponding to the detected processing location. A set position of the scanner optics is detected with a processing location evaluator, and a control program corresponding to the detected set position of the scanner optics is generated with the processing location evaluator.Type: ApplicationFiled: February 24, 2006Publication date: August 17, 2006Inventors: Wolfgang Andreasch, Armin Horn, Peter Kaupp
-
Publication number: 20050269302Abstract: A laser machine tool includes an analyzer for determining at least one beam characteristic of the laser beam. The guidance system of the laser machine tool moves the laser beam relative to the beam analyzer in the transverse direction to determine at least one beam characteristic of the laser beam, and the numeric control for the machine tool processes the information to control the laser beam in the machining operation.Type: ApplicationFiled: June 3, 2005Publication date: December 8, 2005Inventor: Armin Horn
-
Patent number: 6922903Abstract: A method and device for determining the length (b) of at least one of two legs (13, 14), of a workpiece (12) bent toward each other at a bending angle (?) requires location of the workpiece (12) in a defined position. The position of the bending angle vertex (S) and the position of the end (E) of the leg (13, 14) to be measured are determined. Based on the position of the bending angle vertex (S) and of the end (E), the length (b) is calculated as the distance between the bending angle vertex (S) and the end (E). The measuring apparatus includes a system serving to determine the position of the bending angle vertex (S), a unit serving to determine the position of the end (E) and an evaluation unit which, based on the position of the bending angle vertex (S) and of the end (E), calculates the length (b) as the distance between the bending angle vertex (S) and the end (E).Type: GrantFiled: September 11, 2003Date of Patent: August 2, 2005Assignee: Trumpf Werkzeugmaschinen GmbH+Co. KGInventor: Armin Horn
-
Publication number: 20040128846Abstract: A method and device for determining the length (b) of at least one of two legs (13, 14), of a workpiece (12) bent toward each other at a bending angle (&bgr;) requires location of the workpiece (12) in a defined position. The position of the bending angle vertex (S) and the position of the end (E) of the leg (13, 14) to be measured are determined. Based on the position of the bending angle vertex (S) and of the end (E), the length (b) is calculated as the distance between the bending angle vertex (S) and the end (E). The measuring apparatus includes a system serving to determine the position of the bending angle vertex (S), a unit serving to determine the position of the end (E) and an evaluation unit which, based on the position of the bending angle vertex (S) and of the end (E), calculates the length (b) as the distance between the bending angle vertex (S) and the end (E).Type: ApplicationFiled: September 11, 2003Publication date: July 8, 2004Inventor: Armin Horn
-
Publication number: 20030053679Abstract: A method and installation for precision imaging of the geometry of workpieces provides relative movement of a CCD detector (13) and the object workpiece (4) in a guided motion. In the process, the CCD detector (13) images the workpiece (4) segment by segment, and the positions of the CCD detector (13) relative to the workpiece (4) and the positions of the imaged workpiece segments are determined. Prior to functional motion of the CCD detector relative to the workpiece (4) to determine its geometry, a rectilinearity and/or angularity calibration is/are performed and, if necessary, a correction value is defined. In at least one subsequent functional motion of the installation, the correction value is factored in for the determination of the positions of the imaged workpiece segments.Type: ApplicationFiled: September 5, 2002Publication date: March 20, 2003Inventors: Armin Horn, Jochen Krauss
-
Patent number: 6512197Abstract: A laser cutting method employs at least two sensors which are operative during the cutting operation to monitor process parameters and send signals indicative of the monitored parameters determining parameters of the cutting operation in which are indicative of the status of the penetration of the workpiece. The signals from each of the sensors is evaluated by comparing the sensed parameters in the signals with usability criteria to determine the usability of the signals. The signal which compares most favorably with the usability criteria therefor is transmitted to the controller to modify the parameters for the cutting workpiece. In the absence of a control signal from the evaluation, the controller proceeds with the cutting in accordance with parameters which are then operative in the controller. Generally, the selected signal effects the speed of relative movement between the workpiece and cutting head.Type: GrantFiled: March 7, 2002Date of Patent: January 28, 2003Assignee: Trumpf Werkzeugmaschinen GmbH & Co.Inventors: Armin Horn, Uwe Mienhardt, Wolfgang Scholich-Tessmann
-
Publication number: 20020125233Abstract: A laser cutting method employs at least two sensors which are operative during the cutting operation to monitor process parameters and send signals indicative of the monitored parameters determining parameters of the cutting operation in which are indicative of the status of the penetration of the workpiece. The signals from each of the sensors is evaluated by comparing the sensed parameters in the signals with usability criteria to determine the usability of the signals. The signal which compares most favorably with the usability criteria therefor is transmitted to the controller to modify the parameters for the cutting workpiece. In the absence of a control signal from the evaluation, the controller proceeds with the cutting in accordance with parameters which are then operative in the controller. Generally, the selected signal effects the speed of relative movement between the workpiece and cutting head.Type: ApplicationFiled: March 7, 2002Publication date: September 12, 2002Inventors: Armin Horn, Uwe Mienhardt, Wolfgang Scholich-Tessmann
-
Patent number: 6370171Abstract: A laser assembly has at least one optic element (6, 8) in the path of the laser beam (5) and at least partially permeable to the laser beam (5). There is at least one component for detecting the temperature of the optic element (6, 8) or which can detect the intensity of the light beamed by the optic element (6, 8). The laser beam (5) can be controlled to influence the temperature of the optic element (6, 8) depending upon the light intensity detected.Type: GrantFiled: September 21, 1999Date of Patent: April 9, 2002Inventors: Armin Horn, Klaus Fissler