Patents by Inventor Armin Maidhof

Armin Maidhof has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for determining the 3D coordinates of the surface of an object
    Patent number: 7436522
    Abstract: A method serves to determine the 3D coordinates of an object. The 3D coordinates of a partial surface (6) of the object are determined by a 3D measuring device (3), which includes one or more detectors (4) and whose position is determined by a tracking system. The 3D coordinates of an adjacent partial surface (7) of the object are determined by the 3D measuring device (3). The 3D coordinates of an overlap region of he adjacent partial surfaces (6,7) are put together by a matching method. In doing so, an error function is determined and minimized iteratively. Furthermore, the error function of a detector (4) of the 3D measuring device (3) is determined.
    Type: Grant
    Filed: May 18, 2006
    Date of Patent: October 14, 2008
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Marcus Steinbichler, Armin Maidhof, Matthias Prams, Makus Leitner
  • Method and device for determining the 3D profile of an object
    Patent number: 7414732
    Abstract: The invention relates to a method for determining the 3D profile of an object. In order to improve a method of this type, several sections of the object (5) are measured. During at least one measuring operation, at least one reference object (4) is measured. The measured sections of the object (5) are combined (1).
    Type: Grant
    Filed: May 16, 2001
    Date of Patent: August 19, 2008
    Assignee: Steinbichler Optotechnik GmbH
    Inventors: Armin Maidhof, Peter Andrā, Manfred Adlhart, Michael Kaus, Markus Basel, Frank Thoss, Markus Lazar, Thomas Nasswetter, Hans Steinbichler
  • Method for determining the 3D coordinates of the surface of an object
    Publication number: 20060265177
    Abstract: A method serves to determine the 3D coordinates of an object. The 3D coordinates of a partial surface (6) of the object are determined by a 3D measuring device (3), which includes one or more detectors (4) and whose position is determined by a tracking system. The 3D coordinates of an adjacent partial surface (7) of the object are determined by the 3D measuring device (3). The 3D coordinates of an overlap region of the adjacent partial surfaces (6, 7) are put together by a matching method. In doing so, an error function is determined and minimized iteratively. Furthermore, the error function of a detector (4) of the 3D measuring device (3) is determined.
    Type: Application
    Filed: May 18, 2006
    Publication date: November 23, 2006
    Applicant: Steinbichler Optotechnik GmbH
    Inventors: Marcus Steinbichler, Armin Maidhof, Matthias Prams, Markus Leitner
  • Method for calibration of a 3D measuring device
    Publication number: 20050154548
    Abstract: A method is used to calibrate a 3D measuring device (1). In order to calibrate any 3D measuring device (1) without specific manufacturer's know-how, one or more characterizing objects (15, 16, 17) of a reference object (14) are measured at one or more positions in measurement volume (12) of 3D measuring device (1) to be calibrated. A gauge of the measurement error is calculated from the measured values as a function of the position in measurement volume (12). From that, an error correction function is calculated (FIG. 3).
    Type: Application
    Filed: November 1, 2004
    Publication date: July 14, 2005
    Inventors: Markus Basel, Bertram Kaupert, Armin Maidhof, Frieder Petri, Matthias Prams
  • Method and device for determining the 3d profile of an object
    Publication number: 20030112448
    Abstract: The invention relates to a method for determining the 3D profile of an object. In order to improve a method of this type, several sections of the object (5) are measured. During at least one measuring operation, at least one reference object (4) is measured. The measured sections of the object (5) are combined (1).
    Type: Application
    Filed: November 18, 2002
    Publication date: June 19, 2003
    Inventors: Armin Maidhof, Peter Andra, Manfred Adlhart, Michael Kaus, Markus Basel, Frank Thoss, Markus Lazar, Thomas Nasswetter, Hans Steinbichler