Patents by Inventor Arnaud Dubois

Arnaud Dubois has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10317656
    Abstract: An optical tomography apparatus comprises: a polychromatic light source, a one-dimensional optical sensor, an interferometric microscope, a one-dimensional confocal spatial filtering system, an actuation system making it possible to perform a one-way scan depthwise of an object to be observed and a processor for reconstructing a two-dimensional image of a section of the object from a plurality of one-dimensional interferential images acquired by the image sensor during the one-way scan. An optical tomography method based on use of such an apparatus is also provided.
    Type: Grant
    Filed: December 19, 2014
    Date of Patent: June 11, 2019
    Assignees: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE, Institut d'Optique Graduate School, UNIVERSITE PARIS SUD 11
    Inventor: Arnaud Dubois
  • Publication number: 20160320598
    Abstract: An optical tomography apparatus comprises: a polychromatic light source, a one-dimensional optical sensor, an interferometric microscope, a one-dimensional confocal spatial filtering system, an actuation system making it possible to perform a one-way scan depthwise of an object to be observed and a processor for reconstructing a two-dimensional image of a section of the object from a plurality of one-dimensional interferential images acquired by the image sensor during the one-way scan. An optical tomography method based on use of such an apparatus is also provided.
    Type: Application
    Filed: December 19, 2014
    Publication date: November 3, 2016
    Inventor: Arnaud DUBOIS
  • Publication number: 20080246972
    Abstract: A device for the tomographic imaging of an object to be analyzed, the device comprising a light source that emits a light beam with a coherence length substantially equal to the thickness of a slice of the object to be analyzed; and an interferometric imaging system comprising at least one objective, a reference mirror and a light-beam splitting means; wherein the interferometric system is arranged so that the objective defines a first focusing plane at the slice of the object to be analyzed and a second focusing plane at the reference mirror, and wherein the interferometric imaging system comprises at least a first compensating medium positioned between the second focusing plane and the splitting means, the thickness and the optical index of the at least one compensating medium having optical properties such that a first optical path of the light beam emitted from the light source between the first focusing plane and the splitting means is substantially equal to a second optical path of the light beam betwee
    Type: Application
    Filed: August 4, 2006
    Publication date: October 9, 2008
    Inventors: Arnaud Dubois, Albert-Claude Boccara
  • Patent number: 6940602
    Abstract: A method and a device for interferential microscopic imaging of an object which comprises sending a light beam in each of the arms of a two-wave interferometer, one of the arms comprising the object to be analyzed. The phase is subjected to a sinusoidal modulation to a frequency f. The signal modulation results from mechanical oscillation of an assembly of elements of the interferometer. The interference signal (S) is integrated during the phase variation via a multichannel sensor. A computer enables to record the integrated interference signal obtained during each period fraction 1/n and to calculate, subsequently, the image of the object. The invention is potentially useful for characterizing thin layers, for controlling components in microelectronics, for reading data stored in volume (3D) and objects unstable in time; in biology and in vivo studies.
    Type: Grant
    Filed: November 15, 2001
    Date of Patent: September 6, 2005
    Assignee: Centre National de la Recherche Scientific (C.N.R.S.)
    Inventors: Arnaud Dubois, Claude Boccara
  • Publication number: 20050122527
    Abstract: A method for microscopic display of a three-dimensional object wherein the sample (1) is displayed through an interferometer (2). Local probes (9) of nanometric dimensions are introduced in the sample (1). The device for microscopic display of a three-dimensional object includes an interferometer (2), a wide-spectrum source (5), a matrix sensor (6), elements for forming the image of a thin edge of the object on the sensor through the interferometer (2), a unit for processing the image produced by the matrix sensor (6). The device includes elements for inserting local probes in the sample.
    Type: Application
    Filed: January 7, 2003
    Publication date: June 9, 2005
    Inventors: Albert-Claude Boccara, Arnaud Dubois
  • Publication number: 20040061867
    Abstract: A method and a device for interferential microscopic imaging of an object which comprises sending a light beam in each of the arms of a two-wave interferometer, one of the arms comprising the object to be analyzed. The phase is subjected to a sinusoidal modulation to a frequency f. The signal modulation results from mechanical oscillation of an assembly of elements of the interferometer. The interference signal (S) is integrated during the phase variation via a multichannel sensor. A computer enables to record the integrated interference signal obtained during each period fraction 1/n and to calculate, subsequently, the image of the object. The invention is potentially useful for characterizing thin layers, for controlling components in microelectronics, for reading data stored in volume (3D) and objects unstable in time; in biology and in vivo studies.
    Type: Application
    Filed: May 19, 2003
    Publication date: April 1, 2004
    Inventors: Arnaud Dubois, Claude Boccara
  • Patent number: 6588900
    Abstract: The invention concerns a device for observing a body, in particular a viewer, comprising means for illuminating (12) the body (5), means for sampling (400, 450, 500, 700) light coming from an illuminated site (01) of the body and compensating means (20) for measuring a deformation of the wave front of a beam coming from a point of the body (5) and for applying to the light sampled by the sampling means (400, 450, 500, 700) a correction calculated on the basis of said measured deformation.
    Type: Grant
    Filed: January 23, 2002
    Date of Patent: July 8, 2003
    Assignee: Universite Paris 7-Denis Diderot
    Inventors: Jean-François Le Gargasson, Pierre Lena, Claude Boccara, Arnaud Dubois