Abstract: The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterized in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.

Abstract: A device (300) for the relative positioning of an electromagnetic probe network (100) and of an object being tested (200). The device includes at least a sliding element (301) to provide for the relative sliding of the object being tested (200) or of the electromagnetic probe network (100), to move the object being tested (200) or the probe network (100) along at least one sliding direction included in a plane of the probe network (100), and on which is provided a rotation device (320) for the relative rotation of the object being tested (200) and of the probe network (100) about a main rotation axis perpendicular to the sliding direction.

Abstract: The invention relates to a device for controlling a material, the device including at least one transmitter for transmitting an electromagnetic signal at a carrier frequency Fp to illuminate the material and one receiver for receiving the electromagnetic signal, wherein the device further includes a first modulator for modulating the electromagnetic signal at a frequency Fm1, the first modulator being arranged, on the signal path, between the transmitter and the material in order to spatially sample the emitted electromagnetic signal; second modulator for modulating the electromagnetic signal at a frequency Fm2, the second modulator being arranged, on the signal path, between the material and the electromagnetic signal receiver in order to spatially sample the electromagnetic signal passed through the material.

Abstract: The invention relates to a device (300) for the relative positioning of an electromagnetic probe network (100) and of an object being tested (200), wherein said device includes at least a means (301) or the relative sliding of the object being tested (200) and of the electromagnetic probe network (100), capable of moving the object being tested (200) or the probe network (100) along at least one sliding direction included in a plane of the probe network (100), and on which are provided a means (320) for the relative rotation of the object being tested (200) and of the probe network (100) about a main rotation axis perpendicular to the sliding direction.

Abstract: The invention relates to a device (10) for determining at least one characteristic of the electromagnetic radiation of an object being tested, and to a probe network (100), characterised in that it comprises a means (200) for sliding said probe network (100) on itself with a relative offset between the probe network (100) and the object being tested, that is higher than the pitch of the probe network (100) in order to carry out measurements along a plurality of relative positions of the probe network (100) and the object being tested, and to access specific regions of the object being tested; means are provided for positioning, adjusting and aligning the probe network (100) relative to the object being tested in order to move towards/come to/fit onto the object being tested, and means are provided for the mechanical scanning of the probe network around or in front of the object being tested in order to carry out measurements along spherical, cylindrical or planar shapes.

Abstract: The invention relates to a device for controlling a material, said device comprising at least means for transmitting an electromagnetic signal at a carrier frequency Fp to illuminate the material and means for receiving the electromagnetic signal, characterized in that said device further comprises first means for modulating the electromagnetic signal at a frequency Fm1, said modulation means being arranged, on the signal path, between the transmission means and the material in order to spatially sample the emitted electromagnetic signal; second means for modulating the electromagnetic signal at a frequency Fm2, said modulation means being arranged, on the signal path, between the material and the electromagnetic signal reception means in order to spatially sample the electromagnetic signal passed through the material.

Abstract: An apparatus for studying the electromagnetic behavior of an electromagnetic wave-emitting or electromagnetic wave-receiving tool is provided. An anechoic chamber is configured to receive the tool as well as a person handling the tool. At least one analysis antenna is configured to pick-up the electromagnetic waves emitted from or received by the tool. Signals outputted by the analysis antenna are processed, and a radiation diagram associated with the electromagnetic tool is displayed. The radiation diagram is displayed inside the anechoic chamber so that the person handling the electromagnetic tool observes how the handling of the tool affects its electromagnetic behavior.

Abstract: A device determines at least one characteristic of electromagnetic radiation emitted from a test object. A support receives the object. A network of probes is distributed along a substantially circular arc, and the support is disposed in a plane formed by the network of probes or in a plane parallel to the plane formed by the network of probes. The network of probes or the support is pivoted in the plane formed by the network of probes or in the plane parallel to the plane formed by the network of probes about a point located in that plane to vary an angle formed between a given one of the network of probes and the support, and thereby allow measurements to be taken at plural angular positions of the network of probes relative to the test object.

Abstract: The invention relates to an arrangement for measuring the radiation of an electromagnetic device, said arrangement essentially comprising a support (20) for positioning said device, an arc (10), a network of measuring probes that are distributed over the arc (10), essentially describing a circle which is centred on the support, and means for driving the device in rotation between the support (20) and the arc (10), about a geometrical axis merged into the plane of the arc (10). The inventive arrangement is characterised in that the device support (20) and the arc (10) can also be pivoted about a geometrical axis that is transversal to the plane of the arc (10), the device including means for holding the support (20) and the arc (10) in the selected position after rotation about the second geometrical axis.