Patents by Inventor Arnauld Dumont

Arnauld Dumont has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring a three-dimensional object, or assembly of objects
    Patent number: 7092562
    Abstract: In this system, three-dimensional objects (1, 5, 6) in an environment that may be very complex are discerned by identifying their simple contour shapes on images, and the geometric characteristics of these objects and their positions and orientations are then measured. Contours are defined by simple length, inclination, position parameters, etc. The acquired knowledge of the environment is used in each new image to refine the estimates, while introducing new object contours that have appeared, into the model.
    Type: Grant
    Filed: April 26, 2001
    Date of Patent: August 15, 2006
    Assignees: Commissariat a l'Energie Atomique, Compagnie Generale des Matieres Nucleaires
    Inventors: Marc Viala, Sylvie Naudet, Patrick Sayd, Laurent Cohen, Arnauld Dumont, Frédéric Jallon
  • Method for measuring a three-dimensional object, or assembly of objects
    Publication number: 20050063581
    Abstract: In this system, three-dimensional objects (1, 5, 6) in an environment that may be very complex are discerned by identifying their simple contour shapes on images, and the geometric characteristics of these objects and their positions and orientations are then measured. Contours are defined by simple length, inclination, position parameters, etc. The acquired knowledge of the environment is used in each new image to refine the estimates, while introducing new object contours that have appeared, into the model.
    Type: Application
    Filed: April 26, 2001
    Publication date: March 24, 2005
    Inventors: Marc Viala, Sylvie Naudet, Patrick Sayd, Laurent Cohen, Arnauld Dumont, Frederic Jallon