Abstract: A method for optically inspecting a mold (10) for manufacturing ophthalmic lenses such as contact lenses for possible mold defects, including: generating a set of images of the mold (10) for different azimuthal illumination angles (?1, ?9) using an illumination system (20) and an imaging system (30), the latter being aligned such that its focal plane cuts through the mold (10) at a specific axial position along a center axis of the mold (10); generating a focal plane image by averaging pixelwise over the set of images after having masked out in each image those regions that include direct specular reflections from the mold (10); repeating the previous steps for one or a plurality of different axial positions of the focal plane such as to generate a plurality of different focal plane images; identifying one or more image features in the plurality of focal plane images indicative for a possible mold defect; determining for each identified image feature in which focal plane image the identified image feature app

Abstract: A method for optically inspecting a mold (10) for manufacturing ophthalmic lenses such as contact lenses for possible mold defects, including: generating a set of images of the mold (10) for different azimuthal illumination angles (?1, ?9) using an illumination system (20) and an imaging system (30), the latter being aligned such that its focal plane cuts through the mold (10) at a specific axial position along a center axis of the mold (10); generating a focal plane image by averaging pixelwise over the set of images after having masked out in each image those regions that include direct specular reflections from the mold (10); repeating the previous steps for one or a plurality of different axial positions of the focal plane such as to generate a plurality of different focal plane images; identifying one or more image features in the plurality of focal plane images indicative for a possible mold defect; determining for each identified image feature in which focal plane image the identified image feature app

Abstract: An illumination device (20) for a microscope (40) has a laser unit (24) that generates at least one broadband laser light pulse (30); light components (71, 72, 73, 74, 75, 76) of different wavelengths of said broadband laser light pulse (30) being offset in time from one another. A compensation unit (36) disposed in the path of the broadband laser light pulse (30) temporally offsets the light components (71, 72, 73, 74, 75, 76) of the broadband laser light pulse (30) in such a way that they exit the compensation unit (36) simultaneously or nearly simultaneously.

Abstract: An illumination device (20) for a microscope (40) has a laser unit (24) that generates at least one broadband laser light pulse (30); light components (71, 72, 73, 74, 75, 76) of different wavelengths of said broadband laser light pulse (30) being offset in time from one another. A compensation unit (36) disposed in the path of the broadband laser light pulse (30) temporally offsets the light components (71, 72, 73, 74, 75, 76) of the broadband laser light pulse (30) in such a way that they exit the compensation unit (36) simultaneously or nearly simultaneously.