Patents by Inventor Arnold Allenic

Arnold Allenic has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • In-line metrology system
    Patent number: 9123584
    Abstract: A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.
    Type: Grant
    Filed: November 5, 2013
    Date of Patent: September 1, 2015
    Assignee: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Stephan Paul George, II, Sreenivas Jayaraman, Oleh Petro Karpenko, Chong Lim
  • METHOD AND SYSTEM OF PROVIDING DOPANT CONCENTRATION CONTROL IN DIFFERENT LAYERS OF A SEMICONDUCTOR DEVICE
    Publication number: 20150171258
    Abstract: A method and system for controlling the amount of a second material incorporated into a first material by controlling the amount of a third material which can interact with the second material.
    Type: Application
    Filed: February 19, 2015
    Publication date: June 18, 2015
    Inventors: Arnold Allenic, John Barden, Feng Liao, Xilin Peng, Rick C. Powell, Kenneth M. Ring, Gang Xiong
  • PHOTOVOLTAIC DEVICE
    Publication number: 20150155424
    Abstract: In general, a photovoltaic module may include a binary semiconductor layer formed from a vapor rich in one component of a binary semiconductor source.
    Type: Application
    Filed: February 9, 2015
    Publication date: June 4, 2015
    Inventors: Arnold Allenic, Viral Parikh, Rick C. Powell, Gang Xiong
  • Method and system of providing dopant concentration control in different layers of a semiconductor device
    Patent number: 9006020
    Abstract: A method and system for controlling the amount of a second material incorporated into a first material by controlling the amount of a third material which can interact with the second material.
    Type: Grant
    Filed: January 11, 2013
    Date of Patent: April 14, 2015
    Assignee: First Solar, Inc.
    Inventors: Gang Xiong, Rick C. Powell, Xilin Peng, John Barden, Arnold Allenic, Feng Liao, Kenneth M. Ring
  • METHOD AND APPARATUS PROVIDING MULTI-STEP DEPOSITION OF THIN FILM LAYER
    Publication number: 20150079725
    Abstract: A multi-stage method and apparatus for vaporizing and depositing a tellurium containing semiconductor material on a substrate.
    Type: Application
    Filed: November 24, 2014
    Publication date: March 19, 2015
    Inventors: Arnold Allenic, Zhigang Ban, John Barden, Benjamin Milliron, Rick C. Powell
  • Method and apparatus providing multi-step deposition of thin film layer
    Patent number: 8921147
    Abstract: A multi-stage method and apparatus for vaporizing and depositing a tellurium containing semiconductor material on a substrate.
    Type: Grant
    Filed: August 14, 2013
    Date of Patent: December 30, 2014
    Assignee: First Solar, Inc.
    Inventors: Arnold Allenic, Zhigang Ban, John Barden, Benjamin Milliron, Rick C. Powell
  • HIGH EFFICIENCY PHOTOVOLTAIC DEVICE EMPLOYING CADMIUM SULFIDE TELLURIDE AND METHOD OF MANUFACTURE
    Publication number: 20140261688
    Abstract: A photovoltaic device is disclosed including at least one Cadmium Sulfide Telluride (CdSxTe1-x) layer as are methods of forming such a photovoltaic device.
    Type: Application
    Filed: March 13, 2014
    Publication date: September 18, 2014
    Applicant: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Zhigang Ban, Benyamin Buller, Markus Gloeckler, Benjamin Milliron, Xilin Peng, Rick C. Powell, Jigish Trivedi, Oomman K. Varghese, Jianjun Wang, Zhibo Zhao
  • Photovoltaic device
    Patent number: 8785232
    Abstract: A method to improve CdTe-based photovoltaic device efficiency is disclosed. The CdTe-based photovoltaic device can include oxygen or silicon in semiconductor layers.
    Type: Grant
    Filed: July 18, 2013
    Date of Patent: July 22, 2014
    Assignee: First Solar, Inc.
    Inventors: Gang Xiong, Rick C. Powell, Aaron Roggelin, Kuntal Kumar, Arnold Allenic, Kenneth M. Ring, Charles E. Wickersham
  • IN-LINE METROLOGY SYSTEM
    Publication number: 20140065731
    Abstract: A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.
    Type: Application
    Filed: November 5, 2013
    Publication date: March 6, 2014
    Applicant: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Stephan Paul George, II, Sreenivas Jayaraman, Oleh Petro Karpenko, Chong Lim
  • METHOD AND APPARATUS PROVIDING MULTI-STEP DEPOSITION OF THIN FILM LAYER
    Publication number: 20140051206
    Abstract: A multi-stage method and apparatus for vaporizing and depositing a tellurium containing semiconductor material on a substrate.
    Type: Application
    Filed: August 14, 2013
    Publication date: February 20, 2014
    Applicant: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Zhigang Ban, John Barden, Benjamin Milliron, Rick C. Powell
  • In-line metrology system
    Patent number: 8603839
    Abstract: A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.
    Type: Grant
    Filed: July 25, 2011
    Date of Patent: December 10, 2013
    Assignee: First Solar, Inc.
    Inventors: Arnold Allenic, Stephan Paul George, II, Sreenivas Jayaraman, Oleh Karpenko, Chong Lim
  • PHOTOVOLTAIC DEVICE
    Publication number: 20130298992
    Abstract: A method to improve CdTe-based photovoltaic device efficiency is disclosed. The CdTe-based photovoltaic device can include oxygen or silicon in semiconductor layers.
    Type: Application
    Filed: July 18, 2013
    Publication date: November 14, 2013
    Applicant: First Solar, Inc.
    Inventors: Gang Xiong, Rick C. Powell, Aaron Roggelin, Kuntal Kumar, Arnold Allenic, Kenneth M. Ring, Charles E. Wickersham
  • Photovoltaic device
    Patent number: 8497151
    Abstract: A method to improve CdTe-based photovoltaic device efficiency is disclosed. The CdTe-based photovoltaic device can include oxygen or silicon in semiconductor layers.
    Type: Grant
    Filed: February 22, 2010
    Date of Patent: July 30, 2013
    Assignee: First Solar, Inc.
    Inventors: Gang Xiong, Ricky C. Powell, Aaron Roggelin, Kuntal Kumar, Arnold Allenic, Kenneth M. Ring, Charles Wickersham
  • SURFACE MEASUREMENT
    Publication number: 20130115720
    Abstract: A method and apparatus for determining grain size of a surface. A light source is directed at the surface. Reflected light from the surface is detected. A peak surface grain wavelength is determined from the reflected light. The peak surface grain wavelength is converted to a grain size. Grain size of a semiconductor surface is used as a feedback input to control a manufacturing process.
    Type: Application
    Filed: November 7, 2011
    Publication date: May 9, 2013
    Inventors: Arnold Allenic, Oleh Petro Karpenko, Erel Milshtein, Ming L. Yu
  • SYSTEM AND METHOD FOR ESTIMATING THE SHORT CIRCUIT CURRENT OF A SOLAR DEVICE
    Publication number: 20130076367
    Abstract: Described herein is a method and system for determining a short-circuit current of a solar device before the solar device is tested in a solar simulator. A solar device includes a substrate layer, a front contact layer, a window/emitter layer, an absorber layer and a back contact. A thickness of the window/emitter layer and an absorption wavelength of the absorber layer are determined. The window/emitter layer thickness and absorber layer absorption wavelength are used with a fitting parameter that corresponds to transmission properties of the substrate and first contact layers in order to determine the solar device's short-circuit current.
    Type: Application
    Filed: September 12, 2012
    Publication date: March 28, 2013
    Applicant: FIRST SOLAR, INC
    Inventors: Arnold Allenic, Oleh Petro Karpenko
  • PHOTOVOLTAIC DEVICE
    Publication number: 20120152351
    Abstract: In general, a photovoltaic module may include a binary semiconductor layer formed from a vapor rich in one component of a binary semiconductor source.
    Type: Application
    Filed: December 16, 2011
    Publication date: June 21, 2012
    Inventors: Arnold Allenic, Viral Parikh, Rick C. Powell, Gang Xiong
  • PHOTOLUMINESCENCE MEASUREMENT
    Publication number: 20120025100
    Abstract: A photoluminescence measurement system can include an optical source.
    Type: Application
    Filed: August 1, 2011
    Publication date: February 2, 2012
    Inventors: Arnold Allenic, Douglas Bacon, Benyamin Buller, John Christiansen, Erel Milshtein, Avner Regev, Igor Sankin
  • IN-LINE METROLOGY SYSTEM
    Publication number: 20120021539
    Abstract: A metrology system for gauging and spatially mapping a semiconductor material on a substrate can be used in controlling deposition and thermal activation processes.
    Type: Application
    Filed: July 25, 2011
    Publication date: January 26, 2012
    Inventors: Arnold Allenic, Stephan Paul George, II, Sreenivas Jayaraman, Oleh Karpenko, Chong Lim
  • POWDER BLEND
    Publication number: 20120018684
    Abstract: A method for producing uniform powder blends may include a multi-pass riffling process.
    Type: Application
    Filed: July 25, 2011
    Publication date: January 26, 2012
    Inventors: Arnold Allenic, Phillip Gohr, James Hojnicki, Michael Latusek, Richard Scott Odneal, Aaron Roggelin, Jeffrey Short, Christopher Wagner
  • PHOTOVOLTAIC WINDOW LAYER
    Publication number: 20110139240
    Abstract: A discontinuous or reduced thickness window layer can improve the efficiency of CdTe-based or other kinds of solar cells.
    Type: Application
    Filed: December 15, 2010
    Publication date: June 16, 2011
    Applicant: First Solar, Inc.
    Inventors: Arnold Allenic, Benyamin Buller, Markus Gloeckler, Imran Khan, Viral Parikh, Rick C. Powell, Igor Sankin, Gang Xiong