Patents by Inventor Arnoldus P. L. Van Berkel

Arnoldus P. L. Van Berkel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6333965
    Abstract: An X-ray examination apparatus includes an X-ray source with a brightness control signal input, an X-ray image device for providing an X-ray image of an object to be imaged, X-ray absorption means between the X-ray source and the X-ray image device, a brightness control system coupled to the X-ray image device and the brightness control signal input in order to derive a brightness control signal from the X-ray image, and a detection means which is coupled between the X-ray image device and the brightness control signal input in order to exclude a degree of detected absorption from said brightness control signal caused by the absorption means present in the X-ray image. Direct radiation and absorption means (such as filters) in the detected absorption range in a histogram of pixels of the X-ray image are automatically excluded from the brightness control which is thus improved.
    Type: Grant
    Filed: March 30, 2000
    Date of Patent: December 25, 2001
    Assignee: U. S. Philips Corporation
    Inventor: Arnoldus P. L. Van Berkel