Abstract: A method and apparatus to characterize an electronic device comprising generating a Simulation Program with Integrated Circuit Emphasis (SPICE) model of the electronic device, the electronic device having a load. Running a time domain simulation using a waveform as input into the SPICE model of the electronic device and running the time domain simulation for a period of time. Generating a set of operating points for the electronic device at a selected instance during the period of time. And running a frequency domain simulation of the SPICE model using the generated set of operating points said frequency domain simulation using an alternating current (AC) source. The method further comprises generating at least one of a plot, and a behavioral model using the method described above. The above method may be repeated by varying one or more simulation parameters.