Abstract: In various examples, epipolar constraint-based cross-camera calibration validation is disclosed. For a pair of cameras that have partially overlapping fields of view, a shared region of their overlapping fields of view may be extracted and used as the basis to perform an epipolar constraint-guided feature descriptor matching process. A camera calibration metric may be computed based on the degree to which a feature descriptor appearing at a pixel of the first image aligns as expected in the second image with an epipolar line associated with the pixel of the first image, where the epipolar line is computed using extrinsic camera calibration parameters associated with the pair of cameras. Epipolar matching may be performed for a plurality of feature points and an aggregate validation score computed based on measuring the computed deviations for each feature. A sensitivity analysis may be applied to better assess the usefulness of the validation score.

Abstract: In various examples, epipolar constraint-based cross-camera calibration validation is disclosed. For a pair of cameras that have partially overlapping fields of view, a shared region of their overlapping fields of view may be extracted and used as the basis to perform an epipolar constraint-guided feature descriptor matching process. A camera calibration metric may be computed based on the degree to which a feature descriptor appearing at a pixel of the first image aligns as expected in the second image with an epipolar line associated with the pixel of the first image, where the epipolar line is computed using extrinsic camera calibration parameters associated with the pair of cameras. Epipolar matching may be performed for a plurality of feature points and an aggregate validation score computed based on measuring the computed deviations for each feature. A sensitivity analysis may be applied to better assess the usefulness of the validation score.