Abstract: In testing electronic devices having leads, difficulties are frequently encountered in transporting the devices to a test position and holding them securely while engaging the leads during testing. These difficulties are overcome in devices having an indentation in the body portion by engaging the indentation with a movable carrier pin. This pin pushes the device against a wall. In this position at least one lead of the device is arranged in a specific orientation with respect to the body portion. When the pin (and thereby the device) moves toward the test station, the lead contracts a ramp in its path. As the device continues to move, the lead travels up the ramp thereby pivoting the device into a position at approximately a right angle to the specific orientation upon the device reaching the top of the ramp. The lead is then engaged by a centering element which insures proper alignment for testing. After this alignment, the leads of the device are pressed by a plunger against the wall.

Abstract: In making electronic components, it is usually necessary to test and sort the components in accordance with their characteristics. In carrying out such operations, the components are guided along a first portion of a path tangential to a rotatable member having notches spaced in the periphery thereof. The rotatable member is moved to engage one notch with each component to support such component and to space it from the other components in accordance with the spacing of the notches. The rotatable member controllably moves the articles along a second portion of a path adjacent the first portion. The rotatable member is then stopped and the leads of each supported component are straightened. The components are then fed to another rotatable member and controllably moved to a testing facility. While the other rotatable member is stopped, the leads of each component are engaged by contacts of the testing facility to determine certain characteristics of each component.